NOIH2SM1000A Datasheet, PDF (4/66 Pages) ON Semiconductor – HAS2 Image Sensor

NOIH2SM1000A
Data Pack
Each set of devices will have a data pack which will be
made available to the customer. The data pack consists of:
• CoC form referring to the applicable specification
• Calibration data
• Screening Report
• Life Test Report and Radiation (Total Dose) Test
Report for each wafer lot
• Electrical Test Report
• Spectral response data
• Visual Inspection Report
• DPA Test Report
Marking
General
The marking must consist of lead identification and
traceability information.
Lead Identification
An index to pin 1 must be located on the top of the package
in the position defined in Figure 4 on page 24. The pin
numbering is counter clock-wise, when looking at the
top-side of the component.
Traceability Information
Each component must be marked such that complete
traceability is maintained.
The component must have a number as follows:
12
32
11
33
XXXXX = Specific Device Code
A = Assembly Location
WL = Wafer Lot
YY = Year
1
84
WW = Work Week
NNNN = Serial Number
75
74
53
54
Figure 1. Product Marking
Table 5. PACKAGE MARK DECODER
Orderable Part Number
Package Mark: Line 1
Package Mark: Line 2
NOIH2SM1000T-HHC
NOIH2SM1000T
-HHC NNNN
NOIH2SM1000A-HHC
NOIH2SM1000A
-HHC NNNN
NOIH2SM1000S-HHC
NOIH2SM1000S
-HHC NNNN
NOIH2SM1000A-HWC
NOIH2SM1000A
-HWC NNNN
NOIH2SM1000S-HWC
NOIH2SM1000S
-HWC NNNN
where NNNN- serialized number controlled manually by ON Semiconductor, BELGIUM
where DD-MM-YYYY represents the lot assembly date
NOIH2SM1000T-HHC has a Minimum Order Quantity of 10
Package Mark: Line 3
AWLYYWW
AWLYYWW
AWLYYWW
AWLYYWW
AWLYYWW
Electrical and Electro−optical Measurements
Electrical and Electro−optical Measurements at Reference
Temperature
The parameters to be measured to verify the electrical and
electro-optical specifications are given in Table 18 on
page 14 and Table 27 on page 23. Unless otherwise
specified, the measurements must be performed at a
environmental temperature of 22 ±3°C.
For all measurements, the nominal power supply, bias,
and clocking conditions apply. The nominal power supply
and bias conditions are given in Table 28 on page 23; the
timing diagrams in Figure 35 on page 46 and Figure 37 on
page 48.
NOTE: The given bias and power supply settings imply
that the devices are measured in ‘soft-reset’
condition.
Electrical and Electro−optical Measurements at High and
Low Temperature
Table 19 on page 15 and Table 20 on page 16 list the
parameters to be measured to verify electrical and
electro-optical specifications. Unless otherwise specified,
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