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CAT93C56LI-G Datasheet, PDF (3/17 Pages) ON Semiconductor – 2-Kb Microwire Serial CMOS EEPROM
CAT93C56, CAT93C57
Table 4. D.C. OPERATING CHARACTERISTICS, CAT93C56/57, Die Rev. E – Mature Product (CAT93C56, Rev. E –
NOT RECOMMENDED FOR NEW DESIGNS) (VCC = +1.8 V to +5.5 V, TA=−40°C to +125°C unless otherwise specified.)
Symbol
Parameter
Test Conditions
Min
Max
Units
ICC1
Power Supply Current (Write)
ICC2
Power Supply Current (Read)
ISB1
Power Supply Current (Standby)
(x8 Mode)
fSK = 1 MHz, VCC = 5.0 V
fSK = 1 MHz, VCC = 5.0 V
VIN = GND or VCC, CS = GND
ORG = GND
3
mA
500
mA
10
mA
ISB2
ILI
ILO
VIL1
VIH1
VIL2
VIH2
VOL1
VOH1
VOL2
VOH2
Power Supply Current (Standby)
(x16 Mode)
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
VIN = GND or VCC, CS = GND
ORG = Float or VCC
VIN = GND to VCC
VOUT = GND to VCC, CS = GND
4.5 V v VCC < 5.5 V
4.5 V v VCC < 5.5 V
1.8 V v VCC < 4.5 V
1.8 V v VCC < 4.5 V
4.5 V v VCC < 5.5 V, IOL = 2.1 mA
4.5 V v VCC < 5.5 V, IOH = −400 mA
1.8 V v VCC < 4.5 V, IOL = 1 mA
1.8 V v VCC < 4.5 V, IOH = −100 mA
10
mA
1
mA
1
mA
−0.1
0.8
V
2
VCC + 1
V
0
VCC x 0.2
V
VCC x 0.7
VCC + 1
V
0.4
V
2.4
V
0.2
V
VCC − 0.2
V
Table 5. PIN CAPACITANCE (TA = 25°C, f = 1 MHz, VCC = 5 V)
Symbol
Test
Conditions
Min
Typ
Max
Units
COUT (Note 4) Output Capacitance (DO)
VOUT = 0 V
5
pF
CIN (Note 4)
Input Capacitance (CS, SK, DI, ORG)
VIN = 0 V
5
pF
4. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
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