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NSP8814 Datasheet, PDF (1/7 Pages) ON Semiconductor – Transient Voltage Suppressors
NSP8814, NSP8818
Transient Voltage
Suppressors
Low Capacitance Surge Protection for
High Speed Data
The NSP8814 and NSP8818 transient voltage suppressors are
designed specifically to protect 10/100 and GbE Ethernet signals from
high levels of surge current. Low clamping voltage under high surge
conditions make this device an ideal solution for protecting voltage
sensitive lines leading to Ethernet transceiver chips. Low capacitance
combined with flow-through style packaging allows for easy PCB
layout and matched trace lengths necessary to maintain consistent
impedance between high-speed differential lines. The integrated 4 and
8 lines of protection in flow-thru type packages offer a simplified
solution with premier performance for 10/100 and GbE Ethernet
applications.
www.onsemi.com
MARKING
DIAGRAMS
UDFN8
CASE 506CV
4C M
G
4D M
G
Features
• Protection for the Following IEC Standards:
IEC 61000−4−2 (ESD) ±30 kV (Contact)
IEC61000−4−5 (Lightning) 35 A (8/20 ms)
• Flow−Thru Routing Scheme
• 2 pF Max, I/O to I/O
• UL Flammability Rating of 94 V−0
• This is a Pb−Free Device
UDFN10
CASE 506CU
XX = Specific Device Code
M = Date Code
G = Pb−Free Package
ORDERING INFORMATION
Typical Applications
• 10/100 and GbE Ethernet
• MagJacks® / Integrated Magnetics
• Notebooks/Desktops/Servers
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Rating
Symbol
Value
Unit
Operating Junction Temperature Range
TJ
−55 to +125 °C
Storage Temperature Range
Tstg
−55 to +150 °C
Lead Solder Temperature −
Maximum (10 Seconds)
TL
260
°C
IEC 61000−4−2 Contact (ESD)
IEC 61000−4−2 Air (ESD)
ESD
±30
kV
±30
kV
Device
Package
Shipping
NSP8814MUTAG UDFN8 3000 / Tape & Reel
(Pb−Free)
NSP8818MUTAG UDFN10 3000 / Tape & Reel
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Maximum Peak Pulse Current
8/20 ms @ TA = 25°C
10/700 ms @ TA = 25°C
IPP
A
35
20
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
See Application Note AND8308/D for further description of survivability specs.
© Semiconductor Components Industries, LLC, 2017
1
February, 2017 − Rev. 0
Publication Order Number:
NSP8814/D