CM1293 Datasheet, PDF (1/10 Pages) California Micro Devices Corp – 2, 4, and 8-Channel Low Capacitance ESD Protection Arrays

8-Channel Low Capacitance ESD
Protection Arrays
CM1293
Features
• Eight channels of ESD protection
Note: For 2 and 4 channel devices, see the
CM1293A datasheet.
• Provides ESD protection to IEC61000-4-2
• ±8kV contact discharge
• Low loading capacitance of 2.0pF max.
• Low clamping voltage
• Channel I/O to I/O capacitance 1.5pF typical
• Zener diode protects supply rail and eliminates
the need for external by-pass capacitors
• Each I/O pin can withstand over 1000 ESD
strikes*
• Available in MSOP, lead-free packaging
Applications
• DVI ports, HDMI ports in notebooks, set top
boxes, digital TVs, LCD displays
• Serial ATA ports in desktop PCs and hard disk
drives
• PCI Express ports
• General purpose high-speed data line ESD
protection
Product Description
The CM1293 family of diode arrays has been
designed to provide ESD protection for electronic
components or sub-systems requiring minimal
capacitive loading. These devices are ideal for
protecting systems with high data and clock rates or
for circuits requiring low capacitive loading. Each
ESD channel consists of a pair of diodes in series
which steer the positive or negative ESD current
pulse to either the positive (V_P) or negative (V_N)
supply rail. A Zener diode is embedded between V_P
and V_N, offering two advantages. First, it protects the
V_CC rail against ESD strikes, and second, it eliminates
the need for a bypass capacitor that would otherwise
be needed for absorbing positive ESD strikes to
ground. The CM1293 will protect against ESD pulses
up to ( 8kV contact discharge) per the IEC 61000-4-2
Level 4 standard.
This device is particularly well-suited for protecting
systems using high-speed ports such as USB2.0,
IEEE1394 (Firewire®, iLink™), Serial ATA, DVI,
HDMI and corresponding ports in removable storage,
digital camcorders, DVD-RW drives and other
applications where extremely low loading
capacitance with ESD protection are required in a
small package footprint.
Block Diagram
*Standard test condition is IEC61000-4-2 level 4 test circuit with each pin subjected to ±8kV contact discharge for 1000 pulses. Discharges are timed at 1 second intervals and all 1000 strikes are completed in one
continuous test run. The part is then subjected to standard production test to verify that all of the tested parameters are within spec after the 1000 strikes.
©2010 SCILLC. All rights reserved.
April 2010 – Rev. 3
Publication Order Number:
CM1293/D