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| 74F827 Datasheet, PDF (8/13 Pages) NXP Semiconductors – 10-bit buffer/line driver, non-inverting 3-State | |||
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NXP Semiconductors
74F827
10-bit buffer/line driver; non-inverting; 3-state
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
tr
VI
positive
pulse
90 %
VM
10 %
0V
tW
90 %
VM
tr
tf
VM
10 %
001aac221
VI
G
VCC
VO
DUT
RT
a. Input pulse deï¬nition
b. Test circuit
Fig 7.
Test data and VEXT levels are given in Table 8.
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = Test voltage for switching times.
Test circuit for measuring switching times
VEXT
RL
CL
RL
mna616
Table 8.
Input
VI
3.0 V
Test data
fI
1 MHz
tW
500 ns
tr, tf
⤠2.5 ns
Load
CL
50 pF
RL
500 â¦
VEXT
tPHL, tPLH
open
tPZH, tPHZ
open
tPZL, tPLZ
7.0 V
74F827_4
Product data sheet
Rev. 04 â 29 January 2010
© NXP B.V. 2010. All rights reserved.
8 of 13
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