74F827 Datasheet, PDF (5/13 Pages) NXP Semiconductors – 10-bit buffer/line driver, non-inverting 3-State

NXP Semiconductors
74F827
10-bit buffer/line driver; non-inverting; 3-state
9. Static characteristics
Table 6. Static characteristics
Symbol Parameter
Conditions
V_IK
input clamping voltage V_CC = 4.5 V; I_IK = −18 mA
V_OH
HIGH-level output
voltage
V_CC = 4.5 V; V_IL = 0.8 V; V_IH = 2.0 V
I_OH = −15 mA
V_CC = ±10 %
V_CC = ±5 %
I_OH = −24 mA
V_CC = ±10 %
V_CC = ±5 %
V_OL
LOW-level output
voltage
V_CC = 4.5 V; V_IL = 0.8 V; V_IH = 2.0 V
I_OL = 64 mA
V_CC = ±10 %
V_CC = ±5 %
I_I
input leakage current V_CC = 0 V; V_I = 7.0 V
I_IH
HIGH-level input current V_CC = 5.5 V; V_I = 2.7 V
I_IL
LOW-level input current V_CC = 5.5 V; V_I = 0.5 V
I_OZ
OFF-state output current V_CC = 5.5 V
V_O = 2.7 V
V_O = 0.5 V
I_O
output current
V_CC = 5.5 V
I_CC
supply current
V_CC = 5.5 V; V_I = GND or V_CC
outputs HIGH-state
outputs LOW-state
outputs OFF-state
25 °C
0 °C to 70 °C Unit
Min Typ^[1] Max Min Max
−1.2 −0.73 - −1.2 - V
-
-
- 2.4 - V
- 3.3 - 2.4 - V
-
-
- 2.0 - V
-
-
- 2.0 - V
-
-
-
- 0.42 -
-
-
-
-
-
-
-
-
-
- 0.55 V
- 0.55 V
- 100 µA
-
20 µA
- −20 µA
-
-
-
-
50 µA
-
-
-
- −50 µA
[2] _-
-
- −100 −225 mA
-
50
-
-
70
-
-
60
-
-
70 mA
- 100 mA
-
90 mA
[1] All typical values are measured at V_CC = 5 V.
[2] Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
10. Dynamic characteristics
Table 7. Dynamic characteristics
GND = 0 V; for test circuit, see Figure 7.
Symbol Parameter
Conditions
t_PLH
LOW to HIGH
An to Yn; see Figure 5
propagation delay
C_L = 50 pF
C_L = 300 pF, 1 output switching
C_L = 300 pF, 10 outputs switching
25 °C; V_CC = 5.0 V 0 °C to 70 °C; Unit
V_CC = 5.0 V ± 0.5 V
Min Typ Max Min
Max
2.0 5.5 8.5 2.0
- 9.5 13.0
-
- 12.0 16.0
-
9.0 ns
14.0 ns
17.0 ns
74F827_4
Product data sheet
Rev. 04 — 29 January 2010
© NXP B.V. 2010. All rights reserved.
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