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| 74HC21 Datasheet, PDF (7/14 Pages) NXP Semiconductors – Dual 4-input AND gate | |||
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NXP Semiconductors
74HC21
Dual 4-input AND gate
VI 90 %
tW
negative
pulse
VM
GND
10 %
tf
tr
VI
90 %
positive
pulse
VM
10 %
GND
tW
VCC
VI
G
DUT
RT
VM
tr
tf
VM
VO
CL
001aah768
Fig 8.
Test data is given in Table 9.
Deï¬nitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Test circuit for measuring switching times
Table 9.
Type
74HC21
Test data
Input
VI
VCC
tr, tf
6.0 ns
Load
CL
15 pF, 50 pF
Test
tPLH, tPHL
74HC21_5
Product data sheet
Rev. 05 â 7 May 2009
© NXP B.V. 2009. All rights reserved.
7 of 14
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