English
Language : 

74HC3GU04 Datasheet, PDF (6/16 Pages) NXP Semiconductors – Inverter
NXP Semiconductors
74HC3GU04
Inverter
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
001aad983
Fig 6.
Test data is given in Table 10.
Definitions for test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Test circuit for measuring switching times
Table 10. Test data
Type
Input
74HC3GU04
VI
GND to VCC
tr, tf
≤ 6 ns
Load
CL
50 pF
RL
1 kΩ
S1 position
tPHL, tPLH
open
74HC3GU04_4
Product data sheet
Rev. 04 — 11 January 2010
© NXP B.V. 2010. All rights reserved.
6 of 16