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PIP212-12M Datasheet, PDF (5/21 Pages) NXP Semiconductors – DC-to-DC converter powertrain
NXP Semiconductors
PIP212-12M
DC-to-DC converter powertrain
8.3 Upper driver operation
The gate drive to the upper MOSFET is provided by a bootstrap capacitor (typically
100 nF) that is placed between the CBP and CBN pins. This capacitor is charged via an
internal boost switch to a voltage within a few millivolts of VDDC up to a maximum of 12 V
(this is to prevent excessive gate charge losses when VDDC > 12 V). The upper MOSFET
will be switched according to PWM input once the boost capacitor voltage is above
Vth(CBP-CBN) on. When ever the voltage is below Vth(CBP-CBN) off the upper MOSFET will
remain off.
8.4 VDDG regulator
The gate drive to the lower MOSFET is provided by the VDDG pin. A 1 µF capacitor should
be connected between this pin and VSSC. For minimum power loss within the
PIP212-12M, an external power supply of between 5 V and 12 V should be connected to
this pin. The optimum value for this voltage is dependent on the application but in the
majority of cases a 5 V supply is recommended; see Figure 11. In cases where the VDDG
maximum voltage will not be exceeded, the VDDG pin can be connected to the VDDC pin
and the VDDG capacitor can be omitted; see Figure 13.
When VDDC is connected to a supply greater than 9 V, an internal 6.5 V regulator
connected to VDDG can be used to provide the gate drive for the lower MOSFET;
see Figure 12. The VDDG regulator is enabled by leaving the VDDG_EN pin open resulting
in this pin being pulled internally to 5 V. If an external supply is to be connected to VDDG
then the VDDG_EN pin must be connected to VSSC to disable the internal VDDG regulator.
Table 3. VDDG biasing
VDDG_EN
VDDG
Open circuit
internal 6.5 V regulator used (VDDC > 9 V)
VSSC
connection to external supply required
8.5 3-state function
If the input to VI from the PWM controller becomes high impedance, then the VI input is
driven to 2.5 V by an internal voltage divider. A voltage on the VI pin that is in-between the
VIH and VIL levels and present for longer than td(3-state), causes both MOSFETs to be
turned off. Normal operation commences once the VI input is outside this window for
longer than td(3-state).
8.6 Automatic Dead-time Reduction (ADR)
Protection against cross-conduction (shoot-through) is achieved via the insertion of a
delay (or dead-time) between the switching off of one MOSFET and the switching on of
the other MOSFET. The automatic dead-time reduction feature continuously monitors the
body diode of the lower MOSFET adjusting the dead-time to minimize body diode
conduction. This reduces power loss in both the upper and lower MOSFETs due to the
reduction in body diode conduction and reverse recovery charge. The lower power
dissipation leads to higher system efficiency and enables higher frequency operation.
PIP212-12M_4
Product data sheet
Rev. 04 — 23 October 2006
© NXP B.V. 2006. All rights reserved.
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