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SC16C550B Datasheet, PDF (46/48 Pages) NXP Semiconductors – 5 V, 3.3 V and 2.5 V UART with 16-byte FIFOs | |||
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NXP Semiconductors
SC16C550B
5 V, 3.3 V and 2.5 V UART with 16-byte FIFOs
15. Revision history
Table 31. Revision history
Document ID
Release date
Data sheet status
Change notice Supersedes
SC16C550B_5
Modiï¬cations:
20081001
Product data sheet
-
SC16C550B_4
⢠changed all occurrences of âVCCâ to âVDDâ
⢠Section 2 âFeaturesâ: added new 7th bullet (and footnote)
⢠Table 2 âPin descriptionâ: Description for signal DDIS changed from âDDIS is active (LOW) when
the CPU is not reading data. When active, DDIS can disable an external transceiver.â to âDDIS is
active (LOW) when the CPU is reading data. When inactive (HIGH), DDIS can disable an
external transceiver.â
⢠Figure 6 âAutoï¬ow control (auto-RTS and auto-CTS) exampleâ:
â changed âACE1â to âUART 1â; changed âACE2â to âUART 2â
â changed âRCVRâ to âRXâ
â changed âXMITâ to âTXâ
⢠Section 7 âRegister descriptionsâ, ï¬rst paragraph: changed from â... for the ï¬fteen SC16C550B
internal registers.â to â... for the twelve SC16C550B internal registers.â
⢠Table 9 âSC16C550B internal registersâ: changed MCR bit 3 from âOUT2, INT enableâ to âOUT2â
⢠Table 19 âModem Control Register bits descriptionâ:
â description of MCR[3] re-written (removed reference to INT enable)
â description of MCR[4]: changed âTXâ to âTXâ and changed âRXâ to âRXâ
⢠Table 24 âLimiting valuesâ:
â symbol Vn split to show 2 separate conditions: âat D7 to D0 pinsâ and âat input only pinsâ
⢠Table 25 âStatic characteristicsâ: deleted (old) Table note [2] and its reference at Rpu(int)
⢠Table 26 âDynamic characteristicsâ: added Table note [4] and its reference at tRESET
⢠updated soldering information
SC16C550B_4
20070316
Product data sheet
-
SC16C550B_3
SC16C550B_3
20050620
Product data sheet
-
(9397 750 14986)
SC16C550B-02
SC16C550B-02
20041214
Product data
-
(9397 750 14446)
SC16C550B-01
SC16C550B-01
20040326
Product data
-
(9397 750 11967)
SC16C550B_5
Product data sheet
Rev. 05 â 1 October 2008
© NXP B.V. 2008. All rights reserved.
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