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74ABT652A Datasheet, PDF (12/19 Pages) NXP Semiconductors – Octal transceiver/register, non-inverting 3-State
NXP Semiconductors
74ABT652A
Octal transceiver/register; non-inverting; 3-state
VI
negative
pulse
0V
VI
positive
pulse
0V
90 %
10 %
VM
10 %
tf
tr
90 %
VM
tW
90 %
VM
10 %
tr
tf
90 %
VM
10 %
tW
001aai298
VI
G
VCC
VO
DUT
RT
a. Input pulse definition
b. Test circuit
Test data and VEXT levels are given in Table 8.
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = Test voltage for switching times.
Fig 12. Test circuit for measuring switching times
VEXT
RL
CL
RL
mna616
Table 8.
Input
VI
3.0 V
Test data
fI
1 MHz
tW
500 ns
tr, tf
≤ 2.5 ns
Load
CL
50 pF
RL
500 Ω
VEXT
tPHL, tPLH
open
tPZH, tPHZ
open
tPZL, tPLZ
7.0 V
74ABT652A_2
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 02 — 12 March 2010
© NXP B.V. 2010. All rights reserved.
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