SA58637 Datasheet, PDF (11/22 Pages) NXP Semiconductors – 2 X 2.2 W BTL audio amplifier

NXP Semiconductors
SA58637
2 × 2.2 W BTL audio amplifier
14.2 BTL dynamic characterization
The total harmonic distortion-plus-noise (THD+N) as a function of frequency (Figure 8)
was measured with a low-pass filter of 80 kHz. The value of capacitor C3 influences the
behavior of PSRR at low frequencies; increasing the value of C3 increases the
performance of PSRR.
10
THD+N
(%)
1
10^−1
002aac083
(1)
(2)
10^−2
10
10²
10³
P_o = 0.5 W; G_v = 20 dB.
(1) V_CC = 6 V; R_L = 8 Ω.
(2) V_CC = 7.5 V; R_L = 16 Ω.
10⁴
10⁵
f (Hz)
Fig 8. Total harmonic distortion-plus-noise as a
function of frequency
−20
PSRR
(dB)
−40
−60
α_cs
(dB)
−70
−80
−90
002aac084
(1)
(2)
(3)
−100
10
10²
10³
10⁴
10⁵
f (Hz)
V_CC = 6 V; V_O = 2 V; R_L = 8 Ω.
(1) G_v = 30 dB.
(2) G_v = 20 dB.
(3) G_v = 6 dB.
Fig 9. Channel separation as a function of frequency
002aac085
(1)
(2)
−60
(3)
−80
10
10²
10³
10⁴
10⁵
f (Hz)
V_CC = 6 V; R_S = 0 Ω; V_ripple = 100 mV.
(1) G_v = 30 dB.
(2) G_v = 20 dB.
(3) G_v = 6 dB.
Fig 10. Power supply rejection ratio as a function of frequency
SA58637_1
Product data sheet
Rev. 01 — 25 February 2008
© NXP B.V. 2008. All rights reserved.
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