GTL2003 Datasheet, PDF (10/19 Pages) NXP Semiconductors – 8-bit bidirectional low voltage translator

NXP Semiconductors
GTL2003
8-bit bidirectional low voltage translator
12. Dynamic characteristics
12.1 Dynamic characteristics for translator-type application
Table 10. Dynamic characteristics
T_amb = −40 °C to +85 °C; V_ref = 1.365 V to 1.635 V; V_DD1 = 3.0 V to 3.6 V; V_DD2 = 2.36 V to 2.64 V;
GND = 0 V; t_r = t_f ≤ 3.0 ns; unless otherwise specified. Refer to Figure 9.
Symbol Parameter
Conditions
Min Typ^[1] Max Unit
t_PLH
LOW-to-HIGH
propagation delay
Sn to Dn; Dn to Sn ^[2][3] 0.5 1.5 5.5 ns
t_PHL
HIGH-to-LOW
propagation delay
Sn to Dn; Dn to Sn ^[2][3] 0.5 1.5 5.5 ns
[1] All typical values are measured at V_DD1 = 3.3 V, V_DD2 = 2.5 V, V_ref = 1.5 V and T_amb = 25 °C.
[2] Propagation delay is measured using Figure 9 and is a difference measurement. It is not production tested
and is guaranteed by ON-state resistance.
[3] C_io(on) maximum of 30 pF and C_io(off) maximum of 15 pF is guaranteed by design.
V_I
input
V_M
V_M
GND
test jig output
HIGH-to-LOW
LOW-to-HIGH
DUT output
HIGH-to-LOW
LOW-to-HIGH
V_M
t_PHL
V_M
V_M
t_PLH
V_DD2
V_OL
V_DD2
V_M
V_OL
002aad197
V_M = 1.5 V; V_I = GND to 3.0 V.
Fig 7. The input (Sn) to output (Dn) propagation delays
GTL2003_1
Product data sheet
Rev. 01 — 27 July 2007
© NXP B.V. 2007. All rights reserved.
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