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GTL2009 Datasheet, PDF (1/17 Pages) NXP Semiconductors – 3-bit GTL Front-Side Bus frequency comparator
GTL2009
3-bit GTL Front-Side Bus frequency comparator
Rev. 01 — 22 September 2005
Product data sheet
1. General description
The GTL2009 is designed for the Nocona and Dempsey/Blackford dual Intel Xeon
processor platforms to compare the Front-Side Bus (FSB) frequency settings and set the
common FSB frequency at the lowest setting if both processor slots are occupied or the
FSB setting of the occupied processor slot if only one processor is being used. A default
FSB frequency of 100 MHz is initially set upon power-up when VDD is greater than 1.5 V.
Magnitude comparisons and frequency multiplexing to compute the common FSB
frequency occurs when the two 3-bit FSB GTL inputs from the chip sets are valid. The
common FSB frequency GTL outputs switch from the default frequency to the computed
frequency when the GTL reference voltage input (VREF) crosses a static 0.6 V internally
generated input comparator reference voltage. The GTL2009 then continually monitors
the FSB frequency and slot occupied inputs for any further changes.
The Nocona and Dempsey/Blackford Xeon processors specify a VTT of 1.2 V and 1.1 V,
as well as a nominal Vref of 0.76 V and 0.73 V respectively. To allow for future voltage level
changes that may extend Vref to 0.63 of VTT (minimum of 0.693 V with VTT of 1.1 V) the
GTL2009 allows a minimum Vref of 0.66 V. Characterization results show that there is little
DC or AC performance variation between these levels.
The GTL2009 is a companion chip to the GTL2006 platform health management
GTL-to-LVTTL translator and the newer GTL2007 that adds an enable function that
disables the error output to the monitoring agent for platforms that monitor the individual
error conditions from each processor.
2. Features
s Compares FSB frequency inputs to set the lowest frequency as the common bus
frequency.
s Operates at a range of GTL signal levels
s 3.0 V to 3.6 V operation
s LVTTL I/O are not 5 V tolerant
s Companion chip to GTL2006 and GTL2007
s ESD protection exceeds 2000 V HBM per JESD22-A114, 200 V MM per
JESD22-A115 and 1000 V CDM per JESD22-C101
s Latch-up testing is done to JEDEC Standard JESD78, which exceeds 500 mA
s Available in TSSOP16 package