LMH6629_1011 Datasheet, PDF (8/28 Pages) National Semiconductor (TI) – Ultra-Low Noise, High-Speed Operational Amplifier with Shutdown

Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics.
Note 2: Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating
of the device such that T_J = T_A. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where T_J >
T_A.
Note 3: The maximum continuous output current (I_OUT) is determined by device power dissipation limitations. Continuous short circuit operation at elevated
ambient temperature can result in exceeding the maximum allowed junction temperature of 150°C
Note 4: Human Body Model, applicable std. JESD22-A114C. Machine Model, applicable std. JESD22-A115-A. Field Induced Charge Device Model, applicable
std. JESD22-C101-C.
Note 5: Typical numbers are the most likely parametric norm. Bold numbers refer to over-temperature limits.
Note 6: Negative input current implies current flowing out of the device.
Note 7: Drift determined by dividing the change in parameter at temperature extremes by the total temperature change.
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