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OPA2832 Datasheet, PDF (7/37 Pages) National Semiconductor (TI) – Dual, Low-Power, High-Speed, Fixed-Gain Operational Amplifier
OPA2832
www.ti.com ............................................................................................................................................. SBOS327C – FEBRUARY 2005 – REVISED AUGUST 2008
ELECTRICAL CHARACTERISTICS: VS = +3.3V
Boldface limits are tested at +25°C.
At TA = +25°C, G = +2V/V, and RL = 150Ω to VCM = 0.75V, unless otherwise noted (see Figure 62).
OPA2832ID, IDGK
PARAMETER
CONDITIONS
+25°C
+25°C (1)
0°C to
+70°C (2)
UNITS
AC PERFORMANCE (see Figure 62)
Small-Signal Bandwidth
Peaking at a Gain of +1
Slew Rate
G = +1, VO ≤ 0.5VPP
G = +2, VO ≤ 0.5VPP
G = –1, VO ≤ 0.5VPP
VO ≤ 0.5VPP
1V Step
180
MHz
85
59
57
MHz
100
63
61
MHz
8
dB
130
110
100
V/µs
Rise Time
0.5V Step
4.6
5.6
5.7
ns
Fall Time
0.5V Step
4.6
5.6
5.7
ns
Settling Time to 0.1%
1V Step
48
70
80
ns
Harmonic Distortion
5MHz
2nd-Harmonic
3rd-Harmonic
Input Voltage Noise
RL = 150Ω
RL = 500Ω
RL = 150Ω
RL = 500Ω
f > 1MHz
–71
–64
–61
dBc
–74
–70
–64
dBc
–66
–60
–55
dBc
–69
–66
–62
dBc
9.4
nV/√Hz
Input Current Noise
DC PERFORMANCE(4)
f > 1MHz
2.4
pA/√Hz
Gain Error
G = +2
±0.3
±1.5
±1.6
%
G = –1
±0.2
±1.5
±1.6
%
Internal RF and RG
Maximum
400
455
460
Ω
Minimum
400
345
340
Ω
Average Drift
±0.1
%/°C
Input Offset Voltage
±1.4
±7.5
±8.7
mV
Average Offset Voltage Drift
—
±27
µV/°C
Input Bias Current
Input Bias Current Drift
VCM = 0.75V
+5.5
+10
+12
µA
—
±45
nA/°C
Input Offset Current
Input Offset Current Drift
VCM = 0.75V
±0.1
±1.5
±2
µA
—
±10
nA/°C
INPUT
Least Positive Input Voltage
–0.5
–0.3
–0.2
V
Most Positive Input Voltage
1.5
1.4
1.3
V
Input Impedance
Differential Mode
10 || 2.1
kΩ || pF
Common-Mode
400 || 1.2
kΩ || pF
OUTPUT
Least Positive Output Voltage
Most Positive Output Voltage
Current Output, Sinking and Sourcing
RL = 1kΩ to 0.75V
RL = 150Ω to 0.75V
RL = 1kΩ to 0.75V
RL = 150Ω to 0.75V
0.03
0.16
0.18
V
0.1
0.3
0.35
V
3
2.8
2.6
V
3
2.8
2.6
V
±35
±25
±20
mA
Short-Circuit Output Current
Output Shorted to Either Supply
80
mA
Closed-Loop Output Impedance
See Figure 2, f < 100kHz
0.2
Ω
MIN/
MAX
TEST
LEVEL (3)
typ
C
min
B
min
B
typ
C
min
B
max
B
max
B
max
B
max
B
max
B
max
B
max
B
typ
C
typ
C
min
A
max
B
max
A
max
A
max
B
max
A
max
B
max
A
max
B
max
A
max
B
max
B
min
B
typ
C
typ
C
max
B
max
B
min
B
min
B
min
A
typ
C
typ
C
(1) Junction temperature = ambient for +25°C specifications.
(2) Junction temperature = ambient at low temperature limits; junction temperature = ambient +5°C at high temperature limit for over
temperature specifications.
(3) Test levels: (A) 100% tested at +25°C. Over temperature limits by characterization and simulation. (B) Limits set by characterization and
simulation. (C) Typical value only for information.
(4) Current is considered positive out of node.
Copyright © 2005–2008, Texas Instruments Incorporated
Product Folder Link(s): OPA2832
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