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| PC87383 Datasheet, PDF (64/77 Pages) National Semiconductor (TI) – Legacy-Reduced SuperI/O with Fast Infrared Port, Serial Port, Parallel Port and GPIOs for Portable Applications | |||
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7.0 Device Characteristics (Continued)
7.1.5 Voltage Thresholds
Symbol
Parameter1
VDDON
VDD Detected as Power-on
VDDOFF
VDD Detected as Power-off
1. All parameters speciï¬ed for 0°C ⤠TA ⤠70°C.
2. Not tested. Guaranteed by characterization.
Min2
Typ
Max2
Unit
2.2
2.6
2.9
V
2.1
2.5
2.8
V
7.2 DC CHARACTERISTICS OF PINS, BY I/O BUFFER TYPES
The following tables summarize the DC characteristics of all device pins described in Section 1.2 on page 9. The character-
istics describe the general I/O buffer types defined in Table 1 on page 9. For exceptions, refer to Section 7.2.7. The DC char-
acteristics of the system interface meet the PCI2.2 3.3V DC signaling.
7.2.1 Input, PCI 3.3V
Symbol: INPCI
Symbol
Parameter
Conditions
Min
Max Unit
VIH Input High Voltage
0.5VDD VDD + 0.51 V
VIL Input Low Voltage
-0.51
0.3VDD V
lIL2 Input Leakage Current
0 < Vin < VDD
±1
µA
1. Not tested. Guaranteed by design.
2. Input leakage currents include hi-Z output leakage for all bidirectional buffers with TRI-STATE outputs.
7.2.2 Input, TTL Compatible
Symbol: INT
Symbol
Parameter
VIH Input High Voltage
VIL Input Low Voltage
Input Leakage Current
IIL
1. Not tested. Guaranteed by design.
Conditions
VIN = VDD
VIN = VSS
Min
2.0
-0.51
Max
Unit
5.51
V
0.8
V
1
µA
-1
µA
7.2.3 Input, TTL Compatible with Schmitt Trigger
Symbol: INTS
Symbol
Parameter
VIH Input High Voltage
VIL Input Low Voltage
Input Leakage Current
IIL
VH Input Hysteresis
1. Not tested. Guaranteed by design.
2. Not tested. Guaranteed by characterization.
Conditions
VIN = VDD
VIN = VSS
Min
Max
Unit
2.0
5.51
V
-0.5 1
0.8
V
1
µA
-1
µA
2502
mV
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