OPA2835 Datasheet, PDF (6/53 Pages) National Semiconductor (TI) – Ultra Low-Power, Rail-to-Rail Out, Negative Rail In, VFB Op Amp

OPA835
OPA2835
SLOS713E – JANUARY 2011 – REVISED JULY 2013
www.ti.com
SPECIFICATIONS: V_S = 5 V
Test conditions unless otherwise noted: V_S+ = +5 V, V_S– = 0 V, V_OUT = 2 V_PP, R_F = 0 Ω, R_L = 2 kΩ, G = 1 V/V, Input and
Output Referenced to mid-supply. T_A = 25°C. Unless otherwise noted.
PARAMETER
CONDITIONS
MIN
TYP
MAX UNITS
TEST
LEVEL ⁽¹⁾
AC PERFORMANCE
Small-signal bandwidth
Gain-bandwidth product
Large-signal bandwidth
Bandwidth for 0.1dB flatness
Slew rate, Rise/Fall
V_OUT = 100 mV_PP, G = 1
V_OUT = 100 mV_PP, G = 2
V_OUT = 100 mV_PP, G = 5
V_OUT = 100 mV_PP, G = 10
V_OUT = 100 mV_PP, G = 10
V_OUT = 2 V_PP, G = 1
V_OUT = 2 V_PP, G=2
56
22.5
7.4
3.1
31
31
14.5
160/260
MHz
C
MHz
C
MHz
C
MHz
C
V/µs
C
Rise/Fall time
10/7
ns
C
Settling time to 1%, Rise/Fall
Settling time to 0.1%, Rise/Fall
V_OUT = 2 V Step, G = 2
45/45
50/55
ns
C
ns
C
Settling time to 0.01%, Rise/Fall
82/85
ns
C
Overshoot/Undershoot
2.5/1.5
%
C
f = 10 kHz
–135
C
2^nd Order Harmonic Distortion
f = 100 kHz
–105
dBc
C
f = 1 MHz
-70
C
f = 10 kHz
–139
C
3^rd Order Harmonic Distortion
f = 100 kHz
–122
dBc
C
f = 1 MHz
-73
C
2^nd Order Intermodulation Distortion
3^rd Order Intermodulation Distortion
f = 1 MHz, 200 kHz Tone Spacing,
V_OUT Envelope = 2 V_PP
–70
dBc
C
–83
dBc
C
Signal to Noise Ratio, SNR
f = 1kHz, V_OUT = 1 V_RMS, 22kHz bandwidth
0.00015
-116.4
%
C
dBc
Total Harmonic Distortion, THD
f = 1kHz, V_OUT = 1 V_RMS
0.00003
-130
%
C
dBc
C
Input voltage noise
f = 100 KHz
9.3
nV/√Hz
C
Voltage Noise 1/f corner frequency
147
Hz
C
Input current noise
f = 1 MHz
0.45
pA/√Hz
C
Current Noise 1/f corner frequency
14.7
Hz
C
Overdrive recovery time, Over/Under Overdrive = 0.5 V
195/135
ns
C
Closed-loop output impedance
f = 100 kHz
0.028
Ω
C
Channel to channel crosstalk
(OPA2835)
f = 10 kHz
-120
dB
C
(1) Test levels (all values set by characterization and simulation): (A) 100% tested at 25°C; over temperature limits by characterization and
simulation. (B) Not tested in production; limits set by characterization and simulation. (C) Typical value only for information.
6
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