OPA2835 Datasheet, PDF (3/53 Pages) National Semiconductor (TI) – Ultra Low-Power, Rail-to-Rail Out, Negative Rail In, VFB Op Amp

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OPA835
OPA2835
SLOS713E – JANUARY 2011 – REVISED JULY 2013
SPECIFICATIONS: V_S = 2.7 V
Test conditions unless otherwise noted: V_S+ = +2.7 V, V_S– = 0 V, V_OUT = 1 V_PP, R_F = 0 Ω, R_L = 2 kΩ, G = 1 V/V, Input and
Output Referenced to mid-supply. T_A = 25°C. Unless otherwise noted
PARAMETER
CONDITIONS
MIN
TYP
MAX UNITS
TEST
LEVEL ⁽¹⁾
AC PERFORMANCE
Small-signal bandwidth
Gain-bandwidth product
Large-signal bandwidth
Bandwidth for 0.1dB flatness
Slew rate, Rise/Fall
V_OUT = 100 mV_PP, G = 1
V_OUT = 100 mV_PP, G = 2
V_OUT = 100 mV_PP, G = 5
V_OUT = 100 mV_PP, G = 10
V_OUT = 100 mV_PP, G = 10
V_OUT = 1 V_PP, G = 1
V_OUT = 1 V_PP, G = 2
51
22.5
7.2
3
30
24
4
110/130
MHz
C
MHz
C
MHz
C
MHz
C
V/µs
C
Rise/Fall time
9.5/9
ns
C
Settling time to 1%, Rise/Fall
Settling time to 0.1%, Rise/Fall
V_OUT = 1V_STEP, G = 2
35/30
60/65
ns
C
ns
C
Settling time to 0.01%, Rise/Fall
120/90
ns
C
Overshoot/Undershoot
0.5/0.2
%
C
2^nd Order Harmonic Distortion
3^rd Order Harmonic Distortion
2^nd Order Intermodulation Distortion
3^rd Order Intermodulation Distortion
f = 10 kHz, V_{IN_CM} = mid-supply – 0.5V
f = 100 kHz, V_{IN_CM} = mid-supply – 0.5V
f = 1 MHz, V_{IN_CM} = mid-supply – 0.5V
f = 10 kHz, V_{IN_CM} = mid-supply – 0.5V
f = 100 kHz, V_{IN_CM} = mid-supply – 0.5V
f = 1 MHz, V_{IN_CM} = mid-supply – 0.5V
f = 1 MHz, 200 kHz Tone Spacing, V_OUT Envelope = 1
V_PP, V_{IN_CM} = mid-supply – 0.5V
-133
-110
-73
-137
-125
-78
-75
-81
C
dBc
C
C
C
dBc
C
C
dBc
C
dBc
C
Input voltage noise
f = 100 KHz
9.3
nV/√Hz
C
Voltage Noise 1/f corner frequency
147
Hz
C
Input current noise
f = 1 MHz
0.45
pA/√Hz
C
Current Noise 1/f corner frequency
14.7
kHz
C
Overdrive recovery time, Over/Under Overdrive = 0.5 V
140/125
ns
C
Closed-loop output impedance
f = 100 kHz
0.028
Ω
C
Channel to channel crosstalk
(OPA2835)
f = 10 kHz
-120
dB
C
(1) Test levels (all values set by characterization and simulation): (A) 100% tested at 25°C; over temperature limits by characterization and
simulation. (B) Not tested in production; limits set by characterization and simulation. (C) Typical value only for information.
Copyright © 2011–2013, Texas Instruments Incorporated
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