74F525 Datasheet, PDF (6/10 Pages) National Semiconductor (TI) – Programmable Counter

Absolute Maximum Ratings (Note 1)
Storage Temperature
b65 C to a150 C
Ambient Temperature under Bias
b55 C to a125 C
Junction Temperature under Bias
Plastic
b55 C to a175 C
b55 C to a150 C
V_CC Pin Potential to
Ground Pin
b0 5V to a7 0V
Input Voltage (Note 2)
b0 5V to a7 0V
Input Current (Note 2)
b30 mA to a5 0 mA
Voltage Applied to Output
in HIGH State (with V_CC e 0V)
Standard Output
TRI-STATE Output
b0 5V to V_CC
b0 5V to a5 5V
Current Applied to Output
in LOW State (Max)
twice the rated I_OL (mA)
Note 1 Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired Functional operation under
these conditions is not implied
Note 2 Either voltage limit or current limit is sufficient to protect inputs
Recommended Operating
Conditions
Free Air Ambient Temperature
Commercial
0 C to a70 C
Supply Voltage
Commercial
a4 5V to a5 5V
DC Electrical Characteristics
Symbol
Parameter
74F
Units V_CC
Min Typ Max
Conditions
V_IH
Input HIGH Voltage
20
V_IL
Input LOW Voltage
V_CD
Input Clamp Diode Voltage
V_OH
Output HIGH
Voltage
74F 10% V_CC 2 5
74F 5% V_CC
27
V_OL
Output LOW
Voltage
74F 10% V_CC
V
Recognized as a HIGH Signal
08
V
Recognized as a LOW Signal
b1 2
V
Min I_IN e b18 mA
V
Min ^{IOH e b1 mA}
I_OH e b1 mA
05
V
Min ^{IOL e 20 mA}
I_IH
Input HIGH
74F
Current
50
mA
Max ^{VIN e 2 7V}
I_BVI
Input HIGH Current _74F
Breakdown Test
70
mA
Max ^{VIN e 7 0V}
I_CEX
Output HIGH
74F
Leakage Current
50
mA
Max ^{VOUT e VCC}
V_ID
Input Leakage
74F
4 75
Test
V
00
I_ID e 1 9 mA
All Other Pins Grounded
I_OD
Output Leakage
74F
Circuit Current
3 75
mA
00
V_IOD e 150 mV
All Other Pins Grounded
I_IL
I_OS
I_CCH
I_CCL
Input LOW Current
Output Short-Circuit Current
Power Supply Current
Power Supply Current
b0 6
mA
Max ^{VIN e 0 5V (D0 – D15)}
b1 2
V_IN e 0 5V (CP XTR)
b60
b150
mA
Max V_OUT e 0V
106 160
mA Max V_O e HIGH
106 160
mA Max V_O e LOW
6