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CD4023BM Datasheet, PDF (3/6 Pages) National Semiconductor (TI) – Buffered Triple 3-Input NAND,NOR Gate
DC Electrical Characteristics CD4023BC CD4025BC (Note 2)
Symbol
Parameter
Conditions
b40 C
a25 C
a85 C Units
Min Typ Min Typ Max Min Max
IDD
Quiescent Device Current VDD e 5V
VDD e 10V
VDD e 15V
10
0 004 1 0
7 5 mA
20
0 005 2 0
15 mA
40
0 006 4 0
30 mA
VOL Low Level Output Voltage VDD e 5V
VDD e 10V
VDD e 15V
0 05
0 0 05
0 05 V
0 05
0 0 05
0 05 V
0 05
0 0 05
0 05 V
VOH
High Level Output Voltage VDD e 5V
VDD e 10V
VDD e 15V
4 95
9 95
14 95
4 95 5
9 95 10
14 95 15
4 95
V
9 95
V
14 95
V
VIL
Low Level Input Voltage
( l l VDDe5V VOe4 5V
VDDe10V VOe9 0V
VDDe15V VOe13 5V
IO k1mA
15
30
40
2 15
4 30
6 40
15 V
30 V
40 V
VIH
High Level Input Voltage
( l l VDDe5V VOe0 5V
VDDe10V VOe1 0V
VDDe15V VOe1 5V
IO k1mA
35
70
11 0
35
3
70
6
11 0 9
35
V
70
V
11 0
V
IOL
Low Level Output Current VDDe5V VO e 0 4V
(Note 3)
VDD e 10V VO e 0 5V
VDD e 15V VO e 1 5V
0 52
0 44 0 88
13
11 22
36
30
8
0 36
mA
0 90
mA
24
mA
IOH
High Level Output Current VDD e 5V VO e 4 6V
(Note 3)
VDD e 10V VO e 9 5V
VDD e 15V VO e 13 5V
b0 52
b0 44 b0 88
b0 36
mA
b1 3
b1 1 b2 2
b0 90
mA
b3 6
b3 0 b8
b2 4
mA
IIN
Input Current
VDD e 15V VIN e 0V
VDD e 15V VIN e 15V
b0 3
03
b10b5 b0 3
10b5 0 3
b1 0 mA
1 0 mA
Note 1 ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed they are not meant to imply that the devices
should be operated at these limits The table of ‘‘Recommended Operating Conditions’’ and ‘‘Electrical Characteristics’’ provides conditions for actual device
operation
Note 2 VSS e 0V unless otherwise specified
Note 3 IOH and IOL are tested one output at a time
Schematic Diagram
CD4025BM CD4025BC
Device Shown
All Inputs Protected
by Standard CMOS Input
Protection Circuit
TL F 5956 – 4
3