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CD4071BM Datasheet, PDF (2/8 Pages) National Semiconductor (TI) – Quad 2-Input OR, AND Buffered B Series Gate
Absolute Maximum Ratings (Notes 1 2)
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Voltage at Any Pin
Power Dissipation (PD)
Dual-In-Line
Small Outline
b0 5V to VDD a0 5V
700 mW
500 mW
VDD Range
Storage Temperature (TS)
b0 5 VDC to a18 VDC
b65 C to a150 C
Lead Temperature (TL)
(Soldering 10 seconds)
Operating Conditions
Operating Range (VDD)
Operating Temperature Range (TA)
CD4071BM CD4081BM
CD4071BC CD4081BC
260 C
3 VDC to 15 VDC
b55 C to a125 C
b40 C to a85 C
DC Electrical Characteristics CD4071BM CD4081BM (Note 2)
Symbol Parameter
Conditions
b55 C
Min Max
a25 C
Min Typ Max
a125 C
Units
Min Max
IDD
Quiescent Device VDD e 5V
Current
VDD e 10V
VDD e 15V
0 25
0 004 0 25
7 5 mA
0 50
0 005 0 50
15 mA
10
0 006 1 0
30 mA
VOL
Low Level
Output Voltage
VDD e 5V
VDD e 10V
VDD e 15V
( lIOl k 1 mA
0 05
0 05
0 05
0
0 05
0
0 05
0
0 05
0 05 V
0 05 V
0 05 V
VOH
High Level
Output Voltage
VDD e 5V
VDD e 10V
VDD e 15V
( lIOl k 1 mA
4 95
9 95
14 95
4 95
5
9 95
10
14 95 15
4 95
V
9 95
V
14 95
V
VIL
Low Level
VDD e 5V VO e 0 5V
Input Voltage
VDD e 10V VO e 1 0V
VDD e 15V VO e 1 5V
15
2
15
15 V
30
4
30
30 V
40
6
40
40 V
VIH
High Level
VDD e 5V VO e 4 5V
Input Voltage
VDD e 10V VO e 9 0V
VDD e 15V VO e 13 5V
35
70
11 0
35
3
70
6
11 0
9
35
V
70
V
11 0
V
IOL
Low Level Output VDD e 5V VO e 0 4V
Current
VDD e 10V VO e 0 5V
(Note 3)
VDD e 15V VO e 1 5V
0 64
16
42
0 51 0 88
13
2 25
34
88
0 36
mA
09
mA
24
mA
IOH
High Level Output VDD e 5V VO e 4 6V
b0 64
Current
VDD e 10V VO e 9 5V
b1 6
(Note 3)
VDD e 15V VO e 13 5V
b4 2
b0 51
b1 3
b3 4
b0 88
b2 25
b8 8
b0 36
mA
b0 9
mA
b2 4
mA
IIN
Input Current
VDD e 15V VIN e 0V
VDD e 15V VIN e 15V
b0 10
0 10
b10b5 b0 10
10b5 0 10
b1 0 mA
1 0 mA
Note 1 ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed Except for ‘‘Operating Temperature Range’’
they are not meant to imply that the devices should be operated at these limits The table of ‘‘Electrical Characteristics’’ provides conditions for actual device
operation
Note 2 All voltages measured with respect to VSS unless otherwise specified
Note 3 IOH and IOL are tested one output at a time
2