SCAN921025 Datasheet, PDF (1/21 Pages) National Semiconductor (TI) – 30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

December 2001
SCAN921025 and SCAN921226
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer
with IEEE 1149.1 (JTAG) and at-speed BIST
General Description
The SCAN921025 transforms a 10-bit wide parallel
LVCMOS/LVTTL data bus into a single high speed Bus
LVDS serial data stream with embedded clock. The
SCAN921226 receives the Bus LVDS serial data stream and
transforms it back into a 10-bit wide parallel data bus and
recovers parallel clock.
Both devices are compliant with IEEE 1149.1 Standard for
Boundary Scan Test. IEEE 1149.1 features provide the de-
sign or test engineer access via a standard Test Access Port
(TAP) to the backplane or cable interconnects and the ability
to verify differential signal integrity. The pair of devices also
features an at-speed BIST mode which allows the intercon-
nects between the Serializer and Deserializer to be verified
at-speed.
The SCAN921025 transmits data over backplanes or cable.
The single differential pair data path makes PCB design
easier. In addition, the reduced cable, PCB trace count, and
connector size tremendously reduce cost. Since one output
transmits clock and data bits serially, it eliminates clock-to-
data and data-to-data skew. The powerdown pin saves
power by reducing supply current when not using either
device. Upon power up of the Serializer, you can choose to
activate synchronization mode or allow the Deserializer to
use the synchronization-to-random-data feature. By using
the synchronization mode, the Deserializer will establish lock
to a signal within specified lock times. In addition, the em-
bedded clock guarantees a transition on the bus every 12-bit
cycle. This eliminates transmission errors due to charged
cable conditions. Furthermore, you may put the
SCAN921025 output pins into TRI-STATE to achieve a high
impedance state. The PLL can lock to frequencies between
30 MHz and 80 MHz.
Features
n IEEE 1149.1 (JTAG) Compliant and At-Speed BIST test
mode.
n Clock recovery from PLL lock to random data patterns.
n Guaranteed transition every data transfer cycle
n Chipset (Tx + Rx) power consumption < 600 mW (typ)
@ 80 MHz
n Single differential pair eliminates multi-channel skew
n 800 Mbps serial Bus LVDS data rate (at 80 MHz clock)
n 10-bit parallel interface for 1 byte data plus 2 control bits
n Synchronization mode and LOCK indicator
n Programmable edge trigger on clock
n High impedance on receiver inputs when power is off
n Bus LVDS serial output rated for 27Ω load
n Small 49-lead BGA package
Block Diagrams
© 2001 National Semiconductor Corporation DS200248
DS200248-1
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