MNDS26F32M-X-RH Datasheet, PDF (1/12 Pages) National Semiconductor (TI) – QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A

MNDS26F32M-X-RH REV 0C0
MICROCIRCUIT DATA SHEET
Original Creation Date: 05/20/99
Last Update Date: 05/04/01
Last Major Revision Date:
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE
GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883,
METHOD 1019.5, CONDITION A
General Description
The DS26F32 is a quad differential line receiver designed to meet the requirements of EIA
Standards RS-422 and RS-423, and Federal Standards 1020 and 1030 for balanced and
unbalanced digital data transmission.
The DS26F32 offers improved performance due to the use of state-of-the-art L-FAST bipolar
technology. The L-FAST technology allows for higher speeds and lower currents by utilizing
extremely short gate delay times.
The device features an input sensitivity of 200mV over the input common mode range of
+7.0V. The DS26F32 provides an enable function common to all four receivers and TRI-STATE
outputs with 8.0 mA sink capability. Also, a fail-safe input/output relationship keeps the
outputs high when the inputs are open.
The DS26F32 offers optimum performance when used with the DS26F31 Quad Differential Line
Driver.
Industry Part Number
DS26F32
Prime Die
M632
Controlling Document
SEE FEATURES SECTION
NS Part Numbers
DS26F32ME/883
DS26F32MER-QML
DS26F32MJ-QMLV
DS26F32MJ/883
DS26F32MJR-QML
DS26F32MJRQMLV
DS26F32MW-QMLV
DS26F32MW/883
DS26F32MWG/883
DS26F32MWGRQMLV
DS26F32MWR-QML
DS26F32MWRQMLV
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
1
Static tests at
2
Static tests at
3
Static tests at
4
Dynamic tests at
5
Dynamic tests at
6
Dynamic tests at
7
Functional tests at
8A
Functional tests at
8B
Functional tests at
9
Switching tests at
10
Switching tests at
11
Switching tests at
Temp ( ^oC)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
1