MNCLC501A-X Datasheet, PDF (1/14 Pages) National Semiconductor (TI) – HIGH-SPEED OUTPUT CLAMPING OP AMP

MNCLC501A-X REV 0A0
MICROCIRCUIT DATA SHEET
Original Creation Date: 08/06/98
Last Update Date: 03/09/99
Last Major Revision Date: 02/26/99
HIGH-SPEED OUTPUT CLAMPING OP AMP
General Description
The CLC501 is a high-speed current-feedback op amp with the unique feature of output
voltage clamping. This feature allows both the maximum positive (Vhigh) and negative
(Vlow) output voltage levels to be established. This is useful in a number of
applications in which "downstream" circuitry must be protected from overdriving input
signals. Not only can this prevent damage to downstream circuitry, but can also reduce
time delays since saturation is avoided. The CLC501's very fast 1ns overload/clamping
recovery time is useful in applications in which information-containing signals follow
overdriving signals.
Engineers designing high-resolution, subranging A/D systems have long sought an amplifier
capable of meeting the demanding requirements of the residue amplifier function.
Amplifiers providing the residue function must not only settle quickly, but recover from
overdrive quickly, protect the second stage A/D, and provide high fidelity at relatively
high gain settings. The CLC501, which excels in these areas, is the ideal design solution
in this onerous application. To further support this application, the CLC501 is both
characterized and tested at a gain setting of +32, the most common gain setting for
residue amplifier applications.
The CLC501's other features provide a quick, high-performance design solution. Since the
CLC501's current feedback design requires no external compensation, designers need not
spend their time designing compensation networks. The small 8-pin package and low, 180mW
power consumption make the CLC501 ideal in numerous applications having small power and
size budgets.
Industry Part Number
CLC501A
Prime Die
UB1148C
Controlling Document
5962-8997401PA*,MXA**
NS Part Numbers
CLC501AJ-MLS
CLC501AJ-QML*
CLC501AWG-MLS
CLC501AWG-QML**
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
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Static tests at
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Static tests at
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Static tests at
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Dynamic tests at
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Dynamic tests at
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Dynamic tests at
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Functional tests at
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Functional tests at
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Functional tests at
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Switching tests at
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Switching tests at
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Switching tests at
Temp ( ^oC)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
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