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SM8707 Datasheet, PDF (13/20 Pages) Nippon Precision Circuits Inc – Clock Generator with Dual PLLs
SM8707 series
SM8707L
fXTAL = 27.0000MHz, VDD = 3.3V ± 0.3V, VSS = 0V, Ta = – 40 to + 85 °C unless otherwise noted.
Parameter
Symbol
Pins
Condition
Rating
Unit
min
typ
max
External input clock
frequency1
fXTI
XTI
Applies to external clock input use only – 27.0000 –
MHz
Output clock rise time2
tr
MO1, MO2, SO1, CL = 15 pF, transition between VOL =
SO2, AO1, AO2 0.2VDD and VOH = 0.8VDD
–
2.0
–
ns
Output clock fall time2
tf
MO1, MO2, SO1, CL = 15pF, transition between VOH =
SO2, AO1, AO2 0.8VDD and VOL = 0.2VDD
–
2.0
–
ns
Output clock jitter3
tjitter
(1-sigma)
MO1, MO2
SO1, SO2,
AO1, AO2
Ta = 25°C, CL = 15pF, VO = 0.5VDD
–
20
–
ps
–
60
–
ps
Output clock duty cycle2
Dt
MO1, MO2, SO1,
SO2, AO1, AO2
Ta = 25°C, CL = 15pF, VO = 0.5VDD
45
50
55
%
Settling time2
tS
All outputs
excluding XTO
–
–
1
µs
Power-up time2, 4
tP
All outputs
excluding XTO
–
1
5
ms
1. When using an external clock input, the XTI duty should be 50% with 3.3V clock signal amplitude level. The input signal voltage should not exceed the
absolute maximum rating, otherwise damage may occur.
2. The numeric values are measured values obtained using the circuit in Figure 1 and the NPC standard evaluation board.
3. The numeric values are measured values obtained using the circuit in Figure 2 and the NPC standard evaluation board.
4. This is the time, after the supply is turned ON from the OFF state, until the output clock reaches ± 0.1% of the specified frequency.
27MHz
DUT
DUT:Device under test
Active Probe
(HP1152A)
Passive Probe
(HP10435A)
Oscilloscope
(Infinium
HP54845A)
Frequency &
Time Interval
Analyzer
(HP5371A)
Figure 1. Measurement circuit 1
27MHz
DUT
Active Probe
(HP54701A)
DUT:Device under test
Oscilloscope
(HP54720D
+HP54721A)
Jitter
Measurement
System
(ASA, M1)
Figure 2. Measurement circuit 2
NIPPON PRECISION CIRCUITS INC.—13