RFHCS362G_11 Datasheet, PDF (41/54 Pages) Microchip Technology – KEELOQ® Code Hopping Encoder with UHF ASK/FSK Transmitter

rfHCS362G/362F
9.0 ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings†
Ambient Temperature under bias ..............................................................................................................-40°C to +85°C
Storage Temperature .............................................................................................................................. -40°C to +125°C
Total Power Dissipation⁽¹⁾ ....................................................................................................................................700 mW
Absolute Maximum Ratings Encoder
Voltage on VDD with respect to VSS ..............................................................................................................-0.3 to +6.6V
Max. Output Current sunk by any I/O pin................................................................................................................20 mA
Max. Output Current sourced by any I/O pin...........................................................................................................20 mA
Voltage on all other Encoder pins with respect to VSS ................................................................... -0.3 V to (VDD + 0.3V)
Absolute Maximum Ratings Transmitter
Voltage on VDDRF with respect to VSSRF ......................................................................................................-0.3 to +7.0V
Max. Voltage on RFENIN and DATAFSK pins with respect to VSSRF ...............................................-0.3 to (VDDRF +0.3V)
Max. Current into RFENIN and DATAFSK pins.............................................................................................-1.0 to 1.0 mA
Note 1: Power Dissipation is calculated as follows:
PDIS = VDD x {IDD - ∑IOH} + ∑{(VDD-VOH) x IOH} + ∑(VOL x IOL) + VDDRF x {IDDRF - ∑IOHRF} + ∑{(VDDRF-VOHRF) x IOHRF}
†_{NOTICE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the}
device. This is a stress rating only and functional operation of the device at those or any other conditions above
those indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions
for extended periods may affect device reliability.
© 2011 Microchip Technology Inc.
DS41189B-page 41