TH8061 Datasheet, PDF (33/36 Pages) Melexis Microelectronic Systems – Voltage Regulator with integrated LIN Transceiver

TH8061
Voltage Regulator with integrated LIN Transceiver
9. ESD/EMC Remarks
9.1 General Remarks
Electronic semiconductor products are sensitive to Electro Static Discharge (ESD).
Always observe Electro Static Discharge control procedures whenever handling semiconductor products.
9.2 ESD-Test
The TH8061 is tested according MIL883-3015.7 (human body model).
9.3 EMC
The test on EMC impacts is done according to ISO 7637-1 for power supply pins and ISO 7637-3 for data-
and signal pins.
Power Supply pin VSUP:
Testpulse
Condition
1
t1 = 5 s / US = -100 V / tD = 2 ms
2
t1 = 0.5 s / US = 100 V / tD = 0.05 ms
3a/b
US = -150 V/ US = 100 V
burst 100ns / 10 ms / 90 ms break
5
Ri = 0.5 Ω, tD = 400 ms
tr = 0.1 ms / UP+US = 40 V
Duration
5000 pulses
5000 pulses
1h
10 pulses every 1min
Data- and signal pins EN, BUS:
Testpulse
Condition
1
t1 = 5 s / US = -100 V / tD = 2 ms
2
t1 = 0.5 s / US = 100 V / tD = 0.05 ms
3a/b
US = -150 V/ US = 100 V
burst 100ns / 10 ms / 90 ms break
Duration
1000 pulses
1000 pulses
1000 burst
TH8061 – Datasheet
3901008061
Page 33 of 36
June 2004
Rev 007