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DS1318 Datasheet, PDF (6/15 Pages) Dallas Semiconductor – Parallel-Interface Elapsed Time Counter
Parallel-Interface Elapsed Time Counter
AC TEST CONDITIONS
PARAMETER
Input Pulse Levels
Output Load Including Scope and Jig
Input and Output Timing Measurement Reference Levels
Input-Pulse Rise and Fall Times
TEST CONDITION
0 to 2.7V
25pF + 1TTL Gate
VCC / 2
4ns
WARNING:
Under no circumstances are negative undershoots, of any amplitude, allowed when device is in write protection.
Note 2: Limits at -40°C are guaranteed by design and not production tested.
Note 3: All voltages are referenced to ground.
Note 4: OE, CE, WE, EXT, and A3–A0.
Note 5: DQ7–DQ0, SQW, and IRQ, when the outputs are high impedance.
Note 6: Outputs open.
Note 7: Specified with parallel bus inactive.
Note 8: Measured with a 32,768kHz crystal attached to the X1 and X2 pins.
Note 9: The parameter tOSF is the period of time that the oscillator must be stopped for the OSF flag to be set over the voltage
range of 0V ≤ VCC ≤ VCC(MAX) and 1.3V ≤ VBAT ≤ 3.7V.
Note 10: This delay applies only if the oscillator is enabled and running. If the ENOSC bit is 0, tREC is disabled, and the device is
immediately accessible. If CE and OE are low on power-up, the DQ outputs are active. Valid data out is not available until
after tREC.
(VCC = +3.3V, TA = +25°C, unless otherwise noted.)
Typical Operating Characteristics
IBAT vs. TEMPERATURE
VBAT = 3.0V
850
VCC = 0
800
750
700
650
600
-40 -20 0 20 40 60 80
TEMPERATURE (°C)
IBAT vs. VBAT
850
VCC = 0
800
750
700
650
600
550
500
1.5 1.9 2.3 2.7 3.1 3.5
VBACKUP (V)
OSCILLATOR FREQUENCY vs. VOLTAGE
32768.50
32768.45
32768.40
32768.35
32768.30
32768.25
32768.20
32768.15
32768.10
32768.05
32768.00
2.0
2.5
3.0
3.5
4.0
INPUT VOLTAGE (V)
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