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DS1682 Datasheet, PDF (4/14 Pages) Dallas Semiconductor – Total Elapsed Time Recorder with Alarm
DS1682
Timing Diagram
Total-Elapsed-Time Recorder
with Alarm
SDA
tBUF
tF
tLOW
SCL
tHD:STA
STOP START
tR
tHD:DAT
NOTE: TIMING IS REFERENCED TO VIL(MAX) AND VIH(MIN).
tHIGH
tSU:DAT
tHD:STA
tSU:STA
REPEATED
START
tSP
tSU:STO
Note 1: Typical values are at TA = +25°C, VCC = 4.0V.
Note 2: The elapsed time and event counters are backed by three EEPROM arrays, which are used sequentially, allowing up to 3 x
EE. The configuration register, alarm trip-point register, and user memory use a single array, limiting them to one EE.
Note 3: A decoupling capacitor to supply high instantaneous currents during EEPROM writes is recommended. A typical value is
0.01μF. VCC must be maintained above VCC minimum, including transients, during EEPROM writes.
Note 4: VCC must be at or above 2.5V for tEW after the end of an event to ensure data transfer to the EEPROM.
Note 5: Reading data while the contents of EEPROM are transferred to RAM results in incorrect reads.
Note 6: After this period, the first clock pulse is generated.
Note 7: A device must internally provide a hold time of at least 300ns for the SDA signal (referred to the VIH(MIN) of the SCL signal)
to bridge the undefined region of the falling edge of SCL.
Note 8: The maximum tHD:DAT has only to be met if the device does not stretch the low period (tLOW) of the SCL signal.
Note 9: A fast-mode device can be used in a standard-mode system, but the requirement tSU:DAT ≥ 250ns must be met. This is
automatically the case if the device does not stretch the tLOW. If such a device does stretch tLOW, it must output the next
data bit to the SDA line tR(MAX) + tSU:DAT = 1000 + 250 = 1250ns before the SCL line is released.
Note 10: CB—Total capacitance of one bus line in pF.
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