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| MAX3394E Datasheet, PDF (2/20 Pages) Maxim Integrated Products – ±15kV ESD-Protected, High-Drive Current, Dual-/Quad-/ Octal-Level Translators with Speed-Up Circuitry | |||
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±15kV ESD-Protected, High-Drive Current, Dual-/Quad-/
Octal-Level Translators with Speed-Up Circuitry
ABSOLUTE MAXIMUM RATINGS
(All voltages referenced to GND.)
VCC ......................................................................... -0.3V to +6V
VL ............................................................................ -0.3V to +6V
I/O VCC_ ...................................................... -0.3V to VCC + 0.3V
I/O VL_ ........................................................... -0.3V to VL + 0.3V
EN ........................................................................... -0.3V to +6V
Short-Circuit Duration I/O VL_, I/O VCC_ to GND ..... Continuous
Maximum Continuous Current ........................................ ±50mA
Continuous Power Dissipation (TA = +70°C)
8-Pin TDFN (derate 18.2mW/°C above +70°C) ........ 1455mW
9-Bump UCSP (derate 4.7mW/°C above +70°C) ........ 379mW
12-Pin TQFN (derate 16.9mW/°C above +70°C) ........1349mW
12-Bump UCSP (derate 6.5mW/°C above +70°C) ..... 519mW
20-Pin TQFN (derate 20.8mW/°C above +70°C) ........1667mW
20-Bump UCSP (derate 10.0mW/°C above +70°C) .....800mW
Operating Temperature Range ......................... -40°C to +85°C
Storage Temperature Range ........................... -65°C to +150°C
Junction Temperature .....................................................+150°C
Bump Temperature (soldering) ...................................... +235°C
Lead Temperature (soldering, 10s) ............................... +300°C
Stresses beyond those listed under âAbsolute Maximum Ratingsâ may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(VCC = +1.65V to +5.5V, VL = +1.2V to VCC; CIOVL ⤠15pF, CIOVCC ⤠15pF; TA = -40°C to +85°C, unless otherwise noted. Typical val-
ues are at TA = +25°C.) (Note 1)
PARAMETER
POWER SUPPLY
VL Supply Range
VCC Supply Range
Supply Current from VCC
Supply Current from VL
VCC Tri-State Supply Current
VL Tri-State Supply Current
LOGIC I/O
SYMBOL
CONDITIONS
VL
VCC
ICC
IL
ICC-3
IL-3
I/O lines internally
pulled up
MAX3394E
MAX3395E
MAX3396E
I/O lines internally
pulled up
MAX3394E
MAX3395E
MAX3396E
EN = GND, TA = +25°C
EN = GND, TA = +25°C
MIN TYP MAX UNITS
1.2
1.65
VCC
V
5.50
V
150
300
µA
600
30
30
µA
30
3
6
µA
0.7
2
µA
I/O VL_ Input-Voltage High
Threshold
I/O VL_ Input-Voltage Low
Threshold
VIHL
VILL
0.3 x
VL
0.7 x
V
VL
V
I/O VL_ Internal Pullup DC
Resistance
RL
EN = VCC or VL
5
10
20
kΩ
I/O VL_ Source Current During
Low-to-High Transition
IIHL
VL = +1.2V
15
mA
I/O VL_ Sink Current During High-
to-Low Transition
IILL
VCC = +1.65V
10
mA
2 _______________________________________________________________________________________
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