E2667B Datasheet, PDF (6/10 Pages) Keysight Technologies – USB 2.0 Signal Quality Test Option

06 | Keysight | DSOX4USBSQ and DSOX6USBSQ USB 2.0 Signal Quality Test Option for 4000 and 6000 X-Series - Data Sheet
Infiniium Series USB 2.0 Compliance Test Application Capabilities
The following table summarizes the features of Keysight’s various USB test analysis options in InfiniiVision 6000 X-Series and Infiniium
oscilloscopes:
Table 1. USB Testing coverage comparison
USB measurement
EL_2 EL_4 EL_5 Data Eye and Mask Test High speed
SQ
Consecutive, paired JK, and paired KJ jitter
Full and Low speed signal quality
Sync test
Cross-over voltage (low- and full-speed only)
EOP bit-width
Signaling rate
EL_6 Device Rise and Fall Time
Edge rate match (low- and full-speed only)
HTML pass/fail report generation
EL_7 Device Non-Monotonic Edge Test
EL_22 Interpacket Gap Tests
EL_28 Chirp-K Latency
EL_29 Device CHIRP-K Duration
EL_31 Host Hi-Speed Terminations Enable and D+
Disconnect Time
EL_38 EL_39 Device Suspend Timing Response
EL_40 Device Resume Timing Response
EL_27 Device CHIRP Response to Reset from
Hi-Speed Operation
EL_28 Device CHIRP Response to Reset from
Suspend
EL_8 Device J Test
EL_8 Device K Test
EL_9 Device SE0_NAK Test
Inrush Current Test
Drop/Droop Vbus tests
VBus Backdrive tests
Signal integrity testing with InfiniiVision
4000/6000X with the USBSQ option
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Complete USB-IF electrical compliance
testing with Infiniium S-Series N5416A option
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1.  To accurately measure USB 2.0 rise and fall times with less than 10% error for sub 500 ps edges the measurement BW must be at least 2.5 GHz as required
for official USB-IF compliance testing.