E2667B Datasheet, PDF (2/10 Pages) Keysight Technologies – USB 2.0 Signal Quality Test Option

Introduction
The low-speed, full-speed, and hi-speed USB 2.0 serial bus is used today for not only traditional
computer/PC applications, but also for a broad range of embedded connectivity applications. For
years, oscilloscopes have been the primary measurement tool used by electrical engineers to verify
the signal integrity of their USB 2.0 serial bus designs. With the DSOX4USBSQ/DSOX6USBSQ signal
quality test option licensed on a Keysight Technology, Inc. 4000 or 6000 X-Series oscilloscope, you
can now quickly verify the analog quality of your signals generated by USB hubs, hosts, and devices
based on USB-IF compliance standards.
Although USB-IF physical layer compliance testing and certification is not normally performed on
embedded electronic products with USB 2.0 interfaces, for reliability purposes designers of embedded
systems often need to test the physical layer of their designs based on USB-IF specified standards
as a “reality check” to insure signal quality standards are met before releasing their products into
production.
For USB 2.0-based products in the traditional computer/PC/peripheral industry where USB-IF
physical layer testing and certification is normally performed, purchasing a complete suite of high-
performance test equipment to perform full pre-compliance testing is often cost-prohibitive for
smaller companies in this industry. But with Keysight’s USB 2.0 signal quality test option licensed
on InfiniiVision 4000 or 6000 X-Series oscilloscopes, engineers now have a more affordable solution
that can perform what many consider to be the most important series of USB 2.0 physical layer tests
(signal quality) before running their final product through complete certification testing at a USB-IF
designated workshop.
After running a USB 2.0 signal quality test, a complete test report with color-coded pass/fail
measurement results are shown on the scope’s display with a scroll-bar to view all tests and screen
images as shown in Figure 1. In addition, the complete test report can be saved as a HTML file for
test documentation purposes. Figure 2 shows an example test report from a far-end, hi-speed device
signal quality test. In this test, the device marginally failed the EOP bit-width test, but was granted a
waiver.