N1417A Datasheet, PDF (4/16 Pages) Keysight Technologies – Femto/Picoammeter and Electrometer/High Resistance Meter

04 | Keysight | B2980A Series Femto/Picoammeter and Electrometer/High Resistance Meter - Data Sheet
The B2980A series’ unmatched 0.01 fA resolution combines with other
unique features to solve previously intractable measurement challenges
Challenge 1: Instruments that only
have numeric displays do not give
you any control over when to take
data during a transient response.
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Solution 1. The B2980A series’ time domain view (Roll View) lets you
visually choose when to capture data.
The B2980A series’ GUI provides a Roll View that can graphically display data as it is
taken and that also can store up to 100,000 of these data points for later retrieval. With
a sampling rate of up to 100 kHz, the Roll View can reveal real-time measurement trends
and provide valuable insights into the dynamics of your DUT’s behavior. To facilitate this
data analysis, the B2980A series provides flexible graphing capabilities. In Graph View
the electrometers can plot I-V curves on their displays using values from either the
internal voltage source or voltage measurement data. In addition, it is easy to generate
a variety of other X-Y plots such as I-t, V-t, R-t, Q-t, I-R, etc. (specific graphical display
capabilities depend on product model). These powerful and versatile graphical capabilities
allow you to gain valuable insights when making sensitive measurements.
Time domain view (Roll View)
Data recorded up to 100,000 points
Challenge 2: Instruments with only
numeric displays often exhibit instability
in their least significant digits and offer
no information about the measurement’s
mean and standard deviation.
How does the measurement
result distribute?
How fast can the B2980A
series capture data?
Measurement speed is usually
determined by the aperture time of
the integration setting, which is typi-
cally proportional to some number
of power line cycles (PLCs). Smaller
aperture times are obviously more
desirable as long as they provide
sufficient averaging to prevent
power line noise from affecting the
measurement.
However, conventional instruments
often cannot capture fast transients
due to their relatively slow reading
rates that require long overhead
after the aperture closes. In
contrast, the B2980A series’ fast
reading rate (20,000 rdg/s) and
streamlined system architecture
greatly reduce overhead time. As
a result the B2980A series does
not lose data sampling capability
even in its minimum PLC setting,
allowing it to capture more detailed
DUT responses. The example
below compares the data sampling
capability of a conventional
instrument with that of the B2980A
series. As this example shows, the
B2980A series can capture data
with x4 better timing resolution due
to its low measurement overhead.
Original waveform
Solution 2. You can instantly view and evaluate data distributions
using the real-time histogram feature
All low-level measurements carry with them a degree of statistical uncertainty due to
inherent fluctuations in the measurement environment. The conventional method to deal
with this issue involves post-measurement evaluation of the data (usually on a PC) using
a histogram. However, this process can become tedious if you need to perform several
measurement and test setup debug cycles.
Conventional instrument
Keysight B2980A series