U4301B Datasheet, PDF (3/19 Pages) Keysight Technologies – PCI Express 3.0 Analyzer Module

03 | Keysight | U4301B PCI Express^® 3.0 Analyzer Module - Data Sheet
Overview (Continued)
Analysis
and debug
Industry
leading probes
Stimulus and test
U4305B exerciser
–– Supports Gen1 through Gen3, x1
through x16 link width
–– 8 GB of capture buffer per
module
–– Non-intrusive probing that
leverages ESP technology
–– Mid-bus probe supports x1 to
x16 unidirectional, or x1 to x8
bidirectional
–– Solid slot interposer supports
x1 to x16 unidirectional or
bidirectional
–– Flying lead solder down probe
supports x1 and x2 bidirectional
capability on a single probe.
Other standard lane width
configuration support is x4, x8,
and x16
–– M.2 interposer supports testing
of M/B-M PCIe solid state drives
(SSDs)
–– SFF-8639 interposers can be
used with solid state drives
(SSDs) with either single or dual
link support
–– Support for Gen1 through Gen3
and link widths of x1 through
x16
–– Link testing from x1 through
x16 using automated LTSSM
exerciser
–– PCIe, MR-IOV, and SR-IOV
stimulus response testing
–– NVMe root complex
emulation for test and
verification of NVMe devices
–– Protocol test card (PTC) to
measure PCIe Gen3 DUT port
and system BIOS specification
compliance as defined by the
PCI-SIG^® standards