E6716G Datasheet, PDF (3/15 Pages) Keysight Technologies – E6702G cdma2000/IS-95/AMPS

03 | Keysight | E6702F cdma2000/IS-95/AMPS Lab Application - Technical Overview
E6702G Functionality Overview
Meet aggressive time-to-market and production schedules
Growing demand for high-speed data services means the roll out of cdma2000 wireless
devices is essential. The Keysight Technologies, Inc. E6702G cdma2000 lab application,
combined with the E5515C/E (8960) test set provides the critical capabilities needed to
verify and ensure quality RF performance in your cdma2000, IS-95, and AMPS devices.
This lab application, designed for high-volume manufacturing and wireless device
development, allows you to finalize product designs and minimize time-to-volume.
Comprehensive protocol support
The E6702G supports numerous protocol features to enable fast and accurate regression
test of phones. For example, Service Option 033 support provides the ability for the
test set to function as a live packet data network. Simply connect to an external server
or the internet via the rear panel LAN port, and you can test packet data connections
on IS-2000 mobile stations. Support for 1/8th rate traffic gating mode allows accurate
talk time testing. Comprehensive SMS capability allows full testing of a mobile’s SMS
capabilities according to industry test standards. Other features include IS-2000
Release A protocol support, full hybrid mode test capability (in conjunction with
another E5515C/E running the E6706G 1xEV-DO lab application), CDMA authentication
capability, real time Vocoder that supports functional verification, and caller ID.
CDMA forward link emulation
Comprehensive signal generation capabilities including all applicable CDMA channels,
modulation, and an AWGN source (1.8 MHz minimum bandwidth). Support is also
included for the cdma2000 Release A forward link channels such as the F-BCCH and
F-CCCH. Flexible user control of the forward link emulation is provided through easy-to-
use front panel control and remote GPIB.
CDMA transmitter tests
–– Maximum power
–– Minimum power
–– Multi-code waveform quality
–– Handoff waveform quality
–– Open loop power accuracy
–– Open loop power calibration
–– Access probe power
–– Graphical access probe power
–– Code domain power
–– Gated power
–– Code channel timing and phase
–– Spurious emissions
–– Time response of open loop
–– DTX support
–– Uplink
–– Tx dynamic power