B1525A Datasheet, PDF (28/36 Pages) Keysight Technologies – Semiconductor Device Analyzer

28 | Keysight | B1500A Semiconductor Device Analyzer - Data Sheet
Keysight EasyEXPERT group+ Software
Keysight EasyEXPERT group+ GUI based characterization software is available either
on the B1500A’s embedded Windows 7 platform with 15-inch touch screen or on your
PC to accelerate the characterization tasks. It supports efficient and repeatable device
characterization in the entire characterization process from measurement setup
and execution to analysis and data management either interactive manual operation
or automation across a wafer in conjunction with a semiautomatic wafer prober.
EasyEXPERT group+ makes it easy to perform complex device characterization
immediately with the hundreds of ready-to-use measurements (application tests)
furnished, and allows you the option of storing test condition and measurement data
automatically after each measurement in a unique built-in database (workspace),
ensuring that valuable information is not lost and that measurements can be
repeated at a later date. Finally, EasyEXPERT has built-in analysis capabilities
and a graphical programming environment that facilitate the development of
complex testing algorithms.
Key features
- Multiple measurement modes for quick setup and measurement execution
(application test, classic test, tracer test, quick test and oscilloscope view)
– Graphical display, automated analysis capabilities and data generation to Excel
and image for analysis and reporting
– Built-in database (workspace) records test data automatically and simplifies
the data management without numerous data files
– GUI-based control of the Keysight B2200A, B2201A and E5250A switching matrices
– GUI-based self-test, self-calibration and diagnostics menu for hardware maintenance
– EasyEXPERT remote control function supports the remote measurement execution
of application tests that are created on GUI interactively, via the LAN interface
- Data back capability and various data protection feature for shared usage by
multiple users
- Characterization environment is available either on mainframe (embedded Windows 7)
or on user’s PC as a personal and portable analyzer environment. EasyEXPERT group+
can be installed on any PC as many as needed without additional charge.
Application library
EasyEXPERT comes with over 300 application tests conveniently organized by device
type, application, and technology. You can easily edit and customize the furnished appli-
cation tests to fit your specific needs. Application tests are provided for the following
categories; they are subject to change without notice.
Device Type
CMOS Transistor
Bipolar Transistor
Discrete device
Memory
Power device
Nano Device
Reliability test
And more
Application Tests
Id-Vg, Id-Vd, Vth, breakdown, capacitance, QSCV, etc.
Ic-Vc, diode, Gummel plot, breakdown, hfe, capacitance, etc.
Id-Vg, Id-Vd, Ic-Vc, diode, etc.
Vth, capacitance, endurance test, etc.
Pulsed Id-Vg, pulsed Id-Vd, breakdown, etc.
Resistance, Id-Vg, Id-Vd, Ic-Vc, etc.
NBTI/PBTI, charge pumping, electro migration, hot carrier injection,
J-Ramp, TDDB, etc.
And more