CPC7594 Datasheet, PDF (8/20 Pages) Clare, Inc. – Line Card Access Switch

INTEGRATED CIRCUITS DIVISION
CPC7594
1.6.4 Test Switches, SW5 and SW6
Parameter
Test Conditions
Symbol Minimum Typical Maximum
Unit
V_SW1 (differential) = T_TEST to T_BAT
V_SW2 (differential) = R_TEST to R_BAT
All-Off state.
+25 C,
V_SW (differential) = -320 V to gnd
0.1
Off-State
V_SW (differential) = +260 V to -60 V
Leakage Current
+85 C,
V_SW (differential) = -330 V to gnd
I_SW
-
0.2
1
A
V_SW (differential) = +270 V to -60 V
-40 C,
V_SW (differential) = -310 V to gnd
0.1
V_SW (differential) = +250 V to -60 V
I_SW(on) = ±10 mA, ±40 mA,
R_BAT and T_BAT = -2 V
On Resistance
+25 C
38
-
+85 C
R_ON
-
46
70

-40 C
28
-
DC current limit
V_SW (on) = ±10 V, +25 C
V_SW (on) = ±10 V, +85 C
-
125
-
I_SW
80
95
mA
V_SW (on) = ±10 V, -40 C
-
165
250
Dynamic current limit
(t  0.5 s)
Break switches on, all other switches
off. Apply ±1 kV 10x1000 s pulse with
appropriate protection in place.
I_SW
-
2.5
-
A
+25 C, Logic inputs = gnd,
V_SW (T_LINE, R_LINE) = ±320 V
-
0.1
Logic input to switch
output isolation
+85 C, Logic inputs = gnd,
V_SW (T_LINE, R_LINE) = ±330 V
I_SW
-
0.3
1
A
-40 C, Logic inputs = gnd,
V_SW (T_LINE, R_LINE) = ±310 V
-
0.1
dV/dt sensitivity
-
-
-
500
-
V/s
8
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