IS93C46D Datasheet, PDF (6/16 Pages) Integrated Silicon Solution, Inc – 1-KBIT SERIAL ELECTRICALLY ERASABLE PROM

IS93C46D
AC ELECTRICAL CHARACTERISTICS
TA = –40°C to +85°C for Industrial
Symbol Parameter
Test Conditions
fSK
SK Clock Frequency
tSKH SK HIGH Time
tSKL SK LOW Time
tCS
Minimum CS LOW Time
tCSS CS Setup Time
Relative to SK
tDIS Din Setup Time
Relative to SK
tCSH CS Hold Time
Relative to SK
tDIH Din Hold Time
Relative to SK
tPD1 Output Delay to “1”
AC Test
tPD0 Output Delay to “0”
AC Test
tSV
CS to Status Valid
AC Test
tDF
CS to Dout in 3-state
AC Test, CS=VIL
tWP Write Cycle Time
Notes:
1. C L = 100pF
Min. Max. Unit
1.8V ≤ Vcc < 2.5V
0
1
Mhz
2.5V ≤ Vcc < 4.5V
0
2
Mhz
4.5V ≤ Vcc ≤ 5.5V
0
3
Mhz
1.8V ≤ Vcc < 2.5V
250 —
ns
2.5V ≤ Vcc < 4.5V
200 —
ns
4.5V ≤ Vcc ≤ 5.5V
200 —
ns
1.8V ≤ Vcc < 2.5V
250 —
ns
2.5V ≤ Vcc < 4.5V
200 —
ns
4.5V ≤ Vcc ≤ 5.5V
100 —
ns
1.8V ≤ Vcc < 2.5V
250 —
ns
2.5V ≤ Vcc < 4.5V
200 —
ns
4.5V ≤ Vcc ≤ 5.5V
200 —
ns
1.8V ≤ Vcc < 2.5V
200 —
ns
2.5V ≤ Vcc < 4.5V
100 —
ns
4.5V ≤ Vcc ≤ 5.5V
50
—
ns
1.8V ≤ Vcc < 2.5V
100 —
ns
2.5V ≤ Vcc < 4.5V
50
—
ns
4.5V ≤ Vcc ≤ 5.5V
50
—
ns
1.8V ≤ Vcc < 2.5V
0
—
ns
2.5V ≤ Vcc < 4.5V
0
—
ns
4.5V ≤ Vcc ≤ 5.5V
0
—
ns
1.8V ≤ Vcc < 2.5V
50
—
ns
2.5V ≤ Vcc < 4.5V
50
—
ns
4.5V ≤ Vcc ≤ 5.5V
50
—
ns
1.8V ≤ Vcc < 2.5V
— 400
ns
2.5V ≤ Vcc < 4.5V
— 200
ns
4.5V ≤ Vcc ≤ 5.5V
— 100
ns
1.8V ≤ Vcc < 2.5V
— 400
ns
2.5V ≤ Vcc < 4.5V
— 200
ns
4.5V ≤ Vcc ≤ 5.5V
— 100
ns
1.8V ≤ Vcc < 2.5V
— 400
ns
2.5V ≤ Vcc < 4.5V
— 200
ns
4.5V ≤ Vcc ≤ 5.5V
— 200
ns
1.8V ≤ Vcc < 2.5V
— 100
ns
2.5V ≤ Vcc < 4.5V
— 100
ns
4.5V ≤ Vcc ≤ 5.5V
— 100
ns
1.8V ≤ Vcc < 2.5V
— 10
ms
2.5V ≤ Vcc < 4.5V
—
5
ms
4.5V ≤ Vcc ≤ 5.5V
—
5
ms
6
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. 00G
01/15/07