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IS61NLF25672 Datasheet, PDF (26/35 Pages) Integrated Silicon Solution, Inc – 256K x 72, 512K x 36 and 1M x 18 18Mb, FLOW THROUGH (NO WAIT) STATE BUS SRAM | |||
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IS61NLF25672/IS61NVF25672
IS61NLF51236/IS61NVF51236
IS61NLF102418/IS61NVF102418
TAP Electrical Characteristics Over the Operating Range(1,2)
Symbol
Parameter
Test Conditions
VOH1
Output HIGH Voltage
IOH = â2.0 mA
VOH2
Output HIGH Voltage
IOH = â100 µA
VOL1
Output LOW Voltage
IOL = 2.0 mA
VOL2
Output LOW Voltage
IOL = 100 µA
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
IX
Input Leakage Current
VSS ⤠V I ⤠VDDQ
Notes:
1. All Voltage referenced to Ground.
2. Overshoot: VIH (AC) ⤠VDD +1.5V for t ⤠tTCYC/2,
Undershoot: VIL (AC) ⤠0.5V for t ⤠tTCYC/2,
Power-up: VIH < 2.6V and VDD < 2.4V and VDDQ < 1.4V for t < 200 ms.
ISSI ®
Min.
1.7
2.1
â
â
1.7
â0.3
â10
Max.
â
â
0.7
0.2
VDD +0.3
0.7
10
Units
V
V
V
V
V
V
µA
TAP AC ELECTRICAL CHARACTERISTICS(1,2) (OVER OPERATING RANGE)
Symbol Parameter
Min.
Max.
tTCYC
TCK Clock cycle time
100
â
fTF
TCK Clock frequency
â
10
tTH
TCK Clock HIGH
40
â
tTL
TCK Clock LOW
40
â
tTMSS TMS setup to TCK Clock Rise
10
â
tTDIS
TDI setup to TCK Clock Rise
10
â
tCS
Capture setup to TCK Rise
10
â
tTMSH TMS hold after TCK Clock Rise
10
â
tTDIH
TDI Hold after Clock Rise
10
â
tCH
Capture hold after Clock Rise
10
â
tTDOV TCK LOW to TDO valid
â
20
tTDOX TCK LOW to TDO invalid
0
â
Notes:
1. tCS and tCH refer to the set-up and hold time requirements of latching data from the boundary scan register.
2. Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1 ns.
Unit
ns
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
26
Integrated Silicon Solution, Inc. â www.issi.com â 1-800-379-4774
Rev. B
08/26/05
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