IS62WV2568DALL Datasheet, PDF (10/14 Pages) Integrated Silicon Solution, Inc – TTL compatible interface levels

IS62/65WV2568DALL,IS62/65WV2568DBLL
DATA RETENTION SWITCHING CHARACTERISTICS
Symbol Parameter
Test Condition Min.
Vdr
Vcc for Data Retention
See Data Retention Waveform
1.5
Idr
Data Retention Current
(1) 0V < CS2 < 0.2V, or
Com. —
(2) CS1 > VDD - 0.2V, CS2 > Vdd - 0.2V Ind. —
Auto. —
typ.⁽¹⁾ —
tsdr
Data Retention Setup Time See Data Retention Waveform
0
trdr
Recovery Time
See Data Retention Waveform
trc
Note:
1. Typical values are measured at Vcc = Vdr(min), Ta = 25^oC and not 100% tested.
Max.
3.6
7
10
20
2
—
—
Unit
V
µA
ns
ns
DATA RETENTION WAVEFORM (CS2 Controlled)
Data Retention Mode
V_CC
3.0
CS2
2.2V
V_DR
0.4V
GND
t_SDR
CS2 ≤ 0.2V
t_RDR
DATA RETENTION WAVEFORM (CS1 Controlled)
t_SDR
Data Retention Mode
t_RDR
V_CC
3.0V
2.2V
V_DR
CS1
GND
CS1 ≥ V_{CC -} 0.2V
Note: CS2 must satisy either CS2 > Vcc -0.2V or CS2 < 0.2V
10
Integrated Silicon Solution, Inc. — www.issi.com
Rev.  C
05/24/2013