ISL54400 Datasheet, PDF (9/15 Pages) Intersil Corporation – Low Voltage, Dual SPDT, USB/Audio Switches with Negative Signal Capability

ISL54400, ISL54401, ISL54402
Test Circuits and Waveforms (Continued)
V_DD
C
Dx or L or R or Nx
IMPEDANCE
ANALYZER
IN V_BUS or V_IN
COM
GND
Repeat test for all witches. COM designation in diagram
refers to: D-/L, D+/R, COM1, and COM2.
FIGURE 5. CAPACITANCE TEST CIRCUIT
1.3V< V_CM < 2V
OUT +
V_CM
OUT -
10%
90%
t_R
90%
10%
t_F
t_M = | t_R -t_F |
min (t_R or t_F)
FIGURE 6. RISE/FALL TIME MISMATCH TEST
DIN+
DIN-
OUT+
OUT-
t_ri
10%
90%
50%
t_{skew_i}
90%
50%
10%
t_fi
t_ro
90%
10%
90%
50%
t_{skew_o}
50%
t_f0
10%
FIGURE 7A. MEASUREMENT POINTS
V_{DD C}
R_S
DIN+
R_S
DIN-
D+/R
D-/L
D+
OUT+
C_L
D-
OUT-
C_L
GND
|tro - tri| Delay Due to Switch for Rising Input and Rising Output Signals.
|tfo - tfi| Delay Due to Switch for Falling Input and Falling Output Signals.
|tskew_0| Change in Skew through the Switch for Output Signals.
|tskew_i| Change in Skew through the Switch for Input Signals.
FIGURE 7. SKEW TEST
FIGURE 7B. TEST CIRCUIT
9
FN6240.3
July 12, 2006