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ISL54400 Datasheet, PDF (8/15 Pages) Intersil Corporation – Low Voltage, Dual SPDT, USB/Audio Switches with Negative Signal Capability
ISL54400, ISL54401, ISL54402
Test Circuits and Waveforms
VINH
LOGIC
INPUT
VINL
50%
tOFF
tr < 20ns
tf < 20ns
SWITCH
INPUT
VNO
SWITCH
OUTPUT 0V
VOUT
90%
tON
90%
Logic input waveform is inverted for switches that have the opposite
logic sense.
VDD C
SWITCH
INPUT
CONTROL
INPUT
NO or NC
IN
GND
COM
VOUT
RL
300Ω
CL
35pF
Repeat test for all switches. CL includes fixture and stray
capacitance.
VOUT
=
V(NO or NC)
------------R-----L-------------
RL + R(ON)
FIGURE 1A. MEASUREMENT POINTS
FIGURE 1B. TEST CIRCUIT
FIGURE 1. SWITCHING TIMES (ISL54402 ONLY)
VDD C
LOGIC
INPUT
VINH
VINL
NO
VNX
NC
IN
COM
VOUT
RL
300Ω
CL
35pF
SWITCH
OUTPUT
VOUT 0V
90%
LOGIC
INPUT
GND
tD
Repeat test for all switches. CL includes fixture and stray
capacitance.
FIGURE 2A. MEASUREMENT POINTS
FIGURE 2B. TEST CIRCUIT
FIGURE 2. BREAK-BEFORE-MAKE TIME (ISL54402 ONLY)
VDD
C
RON = V1/40mA
Dx or L or R or Nx
VNX
40mA
V1
IN VBUS or VIN
COM
GND
SIGNAL
GENERATOR
VDD
C
L or R or NC
COM
32Ω
IN1
0V or VDD
ANALYZER
RL
COM
R or L or NC
GND
N.C.
Repeat test for all switches. Note: COM designation in diagram
refers to: D-/L, D+/R, COM1, and COM2.
FIGURE 3. RON TEST CIRCUIT
Signal direction through switch is reversed, worst case values
are recorded. Repeat test for all switches. COM designation in
diagram refers to: D-/L, D+/R, COM1, and COM2.
FIGURE 4. AUDIO CROSSTALK TEST CIRCUIT
8
FN6240.3
July 12, 2006