ISL54416 Datasheet, PDF (8/14 Pages) Intersil Corporation – Low Voltage, Dual SPDT, USB/CVBS/ Audio Switches with Negative Signal Capability

ISL54415, ISL54416, ISL54417
Test Circuits and Waveforms (Continued)
V_DD
C
NOx or NCx
IMPEDANCE
ANALYZER
IN V_BUS or V_IN
COMx
GND
Repeat test for all switches.
FIGURE 5. CAPACITANCE TEST CIRCUIT
1.3V< V_CM < 2V
OUT+
V_CM
OUT-
10%
90%
t_R
90%
10%
t_F
t_M = | t_R -t_F |
min (t_R or t_F)
FIGURE 6. RISE/FALL TIME MISMATCH TEST
DIN+
DIN-
OUT+
OUT-
t_ri
10%
90%
50%
t_{skew_i}
90%
50%
10%
t_fi
t_ro
90%
10%
90%
50%
t_{skew_o}
50%
t_f0
10%
FIGURE 7A. MEASUREMENT POINTS
V_{DD C}
DIN+
DIN-
R_S
COM2
R_S
COM1
NO2
NO1
OUT+
C_L
OUT-
C_L
GND
|tro - tri| Delay Due to Switch for Rising Input and Rising Output Signals.
|tfo - tfi| Delay Due to Switch for Falling Input and Falling Output Signals.
|tskew_0| Change in Skew through the Switch for Output Signals.
|tskew_i| Change in Skew through the Switch for Input Signals.
FIGURE 7. SKEW TEST
FIGURE 7B. TEST CIRCUIT
8
FN6318.1
June 27, 2006