ISL54416 Datasheet, PDF (7/14 Pages) Intersil Corporation – Low Voltage, Dual SPDT, USB/CVBS/ Audio Switches with Negative Signal Capability

ISL54415, ISL54416, ISL54417
Test Circuits and Waveforms
V_INH
LOGIC
INPUT
V_INL
50%
t_OFF
t_r < 20ns
t_f < 20ns
SWITCH
INPUT
V_NO
SWITCH
OUTPUT _0V
V_OUT
90%
t_ON
90%
Logic input waveform is inverted for switches that have the opposite
logic sense.
V_{DD C}
SWITCH
INPUT
CONTROL
INPUT
NO or NC
IN
GND
COM
V_OUT
R_L
300Ω
C_L
35pF
Repeat test for all switches. C_L includes fixture and stray
capacitance.
V_OUT
=
V(NO _{or NC)}
------------^R-----^L-------------
R_L + R_(ON)
FIGURE 1A. MEASUREMENT POINTS
FIGURE 1B. TEST CIRCUIT
FIGURE 1. SWITCHING TIMES (ISL54417 ONLY)
V_{DD C}
LOGIC
INPUT
V_INH
V_INL
NO
V_NX
NC
IN
COM
V_OUT
R_L
300Ω
C_L
35pF
SWITCH
OUTPUT
V_{OUT 0V}
90%
LOGIC
INPUT
GND
t_D
Repeat test for all switches. C_L includes fixture and stray
capacitance.
FIGURE 2A. MEASUREMENT POINTS
FIGURE 2B. TEST CIRCUIT
FIGURE 2. BREAK-BEFORE-MAKE TIME (ISL54417 ONLY)
V_DD
C
R_ON = V₁/40mA
V_Nx
NOx or NCx
40mA
V₁
IN ^{VBUS or VIN}
COMx
GND
SIGNAL
GENERATOR
V_DD
C
NCx
COMx
32Ω
IN₁
0V or V_DD
ANALYZER
R_L
COMx
NCx
GND
N.C.
Repeat test for all switches.
FIGURE 3. R_ON TEST CIRCUIT
Signal direction through switch is reversed, worst case values
are recorded. Repeat test for all switches.
FIGURE 4. CROSSTALK TEST CIRCUIT
7
FN6318.1
June 27, 2006