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ISL54062_0911 Datasheet, PDF (8/16 Pages) Intersil Corporation – Negative Signal Swing, Sub-ohm, Dual SPDT
ISL54062
Test Circuits and Waveforms (Continued)
V+
C
*50Ω SOURCE
SIGNAL
GENERATOR
NO OR NC
ANALYZER
RL
IN 0V OR V+
COM
GND
rON = V1/100mA
NO OR NC
VNX
100mA
V1
V+
C
0V OR V+
IN
COM
GND
Signal direction through switch is reversed, worst case values
are recorded. Repeat test for all switches.
FIGURE 4. OFF-ISOLATION TEST CIRCUIT
Repeat test for all switches.
FIGURE 5. rON TEST CIRCUIT
*50Ω SOURCE
SIGNAL
GENERATOR
V+
C
NO1 OR NC1
COM1
50Ω
INX
0V OR V+
ANALYZER
COM2
NC2 OR NO2
NC
GND
RL
Signal direction through switch is reversed, worst case values
are recorded. Repeat test for all switches.
FIGURE 6. CROSSTALK TEST CIRCUIT
IMPEDANCE
ANALYZER
COM
V+
C
IN 0V OR V+
NO OR NC GND
FIGURE 7. ON CAPACITANCE TEST CIRCUIT
8
FN6581.1
November 3, 2009