HCTS283MS Datasheet, PDF (6/9 Pages) Intersil Corporation – Radiation Hardened 4 Bit Binary Full Adder with Fast Carry

Specifications HCTS283MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
100%/5004
100%/5004
100%/5004
100%/5004
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9, Deltas
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Interim Test III (Postburn-In)
PDA
Final Test
100%/5004
100%/5004
100%/5004
1, 7, 9
1, 7, 9, Deltas
2, 3, 8A, 8B, 10, 11
ICC, IOL/H
Group A (Note 1)
Group B
Subgroup B-5
Sample/5005
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11,
(Note 2)
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTES:
1. Alternate Group A, in accordance with Method 5005 of MIL-STD-883, may be exercised.
2. Table 5 parameters only.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
PRE RAD
TEST
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
NOTE: 1. Except FN Test which will be performed 100% Go/No-Go.
READ AND RECORD
PRE RAD
POST RAD
1, 9
Table 4 (Note 1)
TABLE 8. STATIC BURN-IN AND DYNAMIC
OPEN
GROUND
1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
1, 4, 9, 10, 13
2, 3, 5, 6, 7, 8, 11,
-
16
12, 14, 15
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
1, 4, 9, 10, 13
8
-
2, 3, 5, 6, 7, 11, 12,
14, 15, 16
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
8
1, 4, 9, 10, 13
16
NOTES:
1. Each pin except VCC and GND will have a resistor of 10kΩ ± 5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 1KΩ ± 5% for dynamic burn-in
OSCILLATOR
50kHz
25kHz
-
-
-
-
2, 6, 7, 11, 15
3, 5, 12, 14
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
1, 4, 9, 10, 13
8
2, 3, 5, 6, 7, 11, 12, 14, 15, 16
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number 518641
6