X93256 Datasheet, PDF (5/9 Pages) Intersil Corporation – Dual Digitally Controlled Potentiometers

X93256
D.C. OPERATING CHARACTERISTICS (Over recommended operating conditions unless otherwise specified.)
Symbol
Parameter
I_CC1 V_CC active current (Increment)
I_CC2
V_CC active current (Store)
(EEPROM Store)
I_SB Standby supply current
I_LI
I_LI
I_LI
I_LI
V_IH
V_IL
C_IN⁽⁵⁾⁽⁷⁾
CS input leakage current
CS input leakage current
CS input leakage current
INC, U/D input leakage current
CS, INC, U/D input HIGH voltage
CS, INC, U/D input LOW voltage
CS, INC, U/D input capacitance
Min.
Limits
Typ.⁽⁴⁾
50
Max.
250
200
300
600
1400
1
4
±1
60
100
150
120
200
250
±1
V_CC x 0.7
-0.5
V_CC + 0.5
V_CC x 0.1
10
Unit
µA
µA
µA
µA
µA
µA
µA
µA
µA
V
V
pF
Test Conditions
CS = V_IL, U/D = V_IL or V_IH and INC
= 0.4V @ max. t_CYC V_CC = 3V
CS = V_IL, U/D = V_IL or V_IH and INC
= 0.4V @ max. t_CYC V_CC = 5V
CS = V_IH, U/D = V_IL or V_IH and INC
= V_IH @ max. t_WR V_CC = 3V
CS = V_IH, U/D = V_IL or V_IH and INC
= V_IH @ max. t_WR V_CC = 5V
CS = V_CC - 0.3V, U/D and INC =
V_SS or V_CC - 0.3V V_CC = 3V
CS = V_CC - 0.3V, U/D and INC =
V_SS or V_{CC -} 0.3V V_CC = 5V
V_IN = V_CC ⁽⁵⁾
V_CC = 3V, CS = 0 ⁽⁵⁾
V_CC = 5V, CS = 0 ⁽⁵⁾
V_IN = V_SS to V_CC ⁽⁵⁾
(5)
(5)
fV=^CC1M=H3zV^{(,6V) IN = VSS, TA = 25°C,}
ENDURANCE AND DATA RETENTION
Parameter
Minimum endurance
Data retention
Min.
200,000
100
Unit
Data changes per bit
Years
Test Circuit #1
Test Point
V_H/R_H
Circuit #2 SPICE Macro Model
R_TOTAL
R_H
C_H
C_W
C_L ^RL
10pF
10pF
25pF
A.C. CONDITIONS OF TEST
Input pulse levels
Input rise and fall times
Input reference levels
0V to 3V
10ns
1.5V
5
FN8188.0
March 4, 2005