HCTS646MS Datasheet, PDF (5/11 Pages) Intersil Corporation – Radiation Hardened Octal Bus Transceiver/Register, Three-State

Specifications HCTS646MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
Quiescent Current
Output Current (Sink)
Output Current
(Source)
Output Voltage Low
Output Voltage High
Input Leakage
Current
Three-State Output
Leakage Current
Noise Immunity
Functional Test
A Data to B Bus (Store)
B Data to A Bus (Store)
A Data to B Bus
B Data to A Bus
Select to Data
DIR to Output
Enable to Output
DIR to Output
Enable to Output
SYMBOL
ICC
IOL
IOH
VOL
VOH
IIN
IOZ
FN
TPLH,
TPHL
TPLH,
TPHL
TPLH,
TPHL
TPLH,
TPHL
TPLH,
TPHL
TPLZ,
TPHZ
TPLZ,
TPHZ
TPZL,
TPZH
TPZL,
TPZH
(NOTES 1, 2)
CONDITIONS
VCC = 5.5V, VIN = VCC or GND
VCC = 4.5V, VIN = VCC or GND,
VOUT = 0.4V
VCC = 4.5V, VIN = VCC or GND,
VOUT = VCC -0.4V
VCC = 4.5V or 5.5V, VIH = VCC/2,
VIL = 0.8V, IOL = 50µA
VCC = 4.5V or 5.5V, VIH = VCC/2,
VIL = 0.8V, IOH = -50µA
VCC = 5.5V, VIN = VCC or GND
Applied Voltage = 0V or VCC, VCC = 5.5V
VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V, (Note 3)
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
VCC = 4.5V
TEMPERATURE
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
200K RAD
LIMITS
MIN MAX
-
0.75
6.0
-
-6.0
-
-
0.1
VCC
-
-0.1
-
±5
-
±50
-
-
2
36
2
37
2
27
2
27
2
34
2
31
2
31
2
34
2
36
UNITS
mA
mA
mA
V
V
µA
µA
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25^oC)
PARAMETER
ICC
IOL/IOH
IOZL/IOZH
GROUP B
SUBGROUP
5
5
5
DELTA LIMIT
12µA
-15% of 0 Hour
±200nA
Spec Number 518628
710