HCS02MS Datasheet, PDF (5/8 Pages) Intersil Corporation – Radiation Hardened Quad 2-Input NOR Gate

Specifications HCS02MS
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OSCILLATOR
OPEN
GROUND
1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V
50kHz
25kHz
STATIC BURN-IN I TEST CONDITIONS (Note 1)
1, 4, 10, 13
2, 3, 5, 6, 7, 8, 9, 11, 12
-
14
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
1, 4, 10, 13
7
-
2, 3, 5, 6, 8, 9, 11,
-
-
12, 14
DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)
-
7
1, 4, 10, 13
14
2, 3, 5, 6, 8, 9,
-
11, 12
NOTES:
1. Each pin except VCC and GND will have a resistor of 10KΩ ± 5% static burn-in.
2. Each Pin except VCC and GND will have a resistor of 1kΩ ± 5% for dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
1, 4, 10, 13
7
2, 3, 5, 6, 8, 9, 11, 12, 14
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number 518744
5